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Formation conditions and temperature dependence of forbidden reflections during resonant X-ray diffraction in zinc oxide single crystals

DOI: 10.1134/S1063774507040062 DOI Help

Authors: A. M. Kolchinskaya (Moscow State University) , V. E. Dmitrienko (AV Shubnikov Institute of Crystallography) , S Collins (Diamond Light Source) , E N Ovchinnikova (Moscow State University) , A. P. Oreshko (Russian Academy of Sciences)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Crystallography Reports , VOL 52 (4) , PAGES 604 - 610

State: Published (Approved)
Published: July 2007

Abstract: Different mechanisms of formation of purely resonant reflections hhl (h = 2n + 1) during resonant diffraction of X-ray synchrotron radiation in zinc oxide, whose intensity very strongly changes with an increase in temperature, are considered. Such reflections, forbidden in the dipole-dipole scattering, can be excited owing to the dipole-quadrupole scattering and the anisotropy of X-ray susceptibility induced by thermal motion of atoms and point defects. Different contributions are theoretically considered and it is shown that they can be separated owing to their different temperature dependences.

Journal Keywords: Anisotropy; Dipoles; Monocrystals; Point Defects; Reflection; Synchrotron Radiation; Temperature Dependence; X Radiation; X-Ray Diffraction; Zinc Oxides

Subject Areas: Engineering


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