# Article Metrics

## Rotation of X-ray polarization in the glitches of a silicon crystal monochromator

DOI: 10.1107/S1600576716009183

Authors: John Sutter (Diamond Light Source) , Roberto Boada Romero (Diamond Light Source) , Daniel Bowron (Science and Technology Facilities Council (STFC)) , Sergey Stepanov (Advanced Photon Source) , Sofia Diaz-moreno (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Applied Crystallography , VOL 49 , PAGES 1209-1222

State: Published (Approved)
Published: August 2016

Open Access

Abstract: EXAFS studies on dilute samples are usually carried out by collecting the fluorescence yield using a large-area multi-element detector. This method is susceptible to the glitches'' produced by all single-crystal monochromators. Glitches are sharp dips or spikes in the diffracted intensity at specific crystal orientations. If incorrectly compensated, they degrade the spectroscopic data. Normalization of the fluorescence signal by the incident flux alone is sometimes insufficient to compensate for the glitches. Measurements performed at the state-of-the-art wiggler beamline I20-scanning at the Diamond Light Source have shown that the glitches alter the spatial distribution of the sample’s quasi-elastic X-ray scattering. Because glitches result from additional Bragg reflections, multiple-beam dynamical diffraction theory is necessary to understand their effects. Here, the glitches of the Si (111) four-bounce monochromator of I20-scanning just above the Ni $K$ edge are associated with their Bragg reflections. A fitting procedure that treats coherent and Compton scattering is developed and applied to a sample of extremely dilute (100~micromolal) aqueous solution of Ni(NO$_3$)$_2$. The depolarization of the wiggler X-ray beam out of the electron orbit is modeled. The fits achieve good agreement with the sample's quasi-elastic scattering with just a few parameters. The X-ray polarization is rotated up to $\pm 4.3^\circ$ within the glitches, as predicted by dynamical diffraction. These results will help users normalize EXAFS data at glitches.

Journal Keywords: X-ray monochromator glitches, X-ray polarization, EXAFS

Subject Areas: Technique Development, Physics

Instruments: I20-Scanning-X-ray spectroscopy (XAS/XES)

Documents:
te5014.pdf