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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

DOI: 10.3791/53025 DOI Help

Authors: Shashidhara Marathe (Advanced Photon Source, Argonne National Laboratory; Diamond Light Source) , Xianbo Shi (Advanced Photon Source, Argonne National Laboratory) , Michael J. Wojcik (Advanced Photon Source, Argonne National Laboratory) , Albert T. Macrander (Advanced Photon Source, Argonne National Laboratory) , Lahsen Assoufid (Advanced Photon Source, Argonne National Laboratory)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Visualized Experiments

State: Published (Approved)
Published: October 2016

Abstract: A procedure for a technique to measure the transverse coherence of synchrotron radiation X-ray sources using a single phase grating interferometer is reported. The measurements were demonstrated at the 1-BM bending magnet beamline of the Advanced Photon Source (APS) at Argonne National Laboratory (ANL). By using a 2-D checkerboard π/2 phase-shift grating, transverse coherence lengths were obtained along the vertical and horizontal directions as well as along the 45° and 135° directions to the horizontal direction. Following the technical details specified in this paper, interferograms were measured at different positions downstream of the phase grating along the beam propagation direction. Visibility values of each interferogram were extracted from analyzing harmonic peaks in its Fourier Transformed image. Consequently, the coherence length along each direction can be extracted from the evolution of visibility as a function of the grating-to-detector distance. The simultaneous measurement of coherence lengths in four directions helped identify the elliptical shape of the coherence area of the Gaussian-shaped X-ray source. The reported technique for multiple-direction coherence characterization is important for selecting the appropriate sample size and orientation as well as for correcting the partial coherence effects in coherence scattering experiments. This technique can also be applied for assessing coherence preserving capabilities of X-ray optics.

Journal Keywords: Engineering; Issue 116; Coherence; Interferometry; Metrological instrumentation; Talbot and self-imaging effects; Diffraction gratings; Visibility; Physics

Subject Areas: Technique Development, Physics

Facility: Advanced Photon Source, Argonne National Laboratory

Added On: 10/11/2016 13:43

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