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Energy dispersive detector for white beam synchrotron x-ray fluorescence imaging

DOI: 10.1063/1.4952928 DOI Help

Authors: Matthew Wilson (Rutherford Appleton Laboratory) , Thomas Connolley (Diamond Light Source) , Igor P. Dolbnya (Diamond Light Source) , Patrick S. Grant (Department of Materials, University of Oxford) , Enzo Liotti (, Univ Department of Materialsersity of Oxford) , Andrew Lui (Department of Materials, University of Oxford) , Andrew Malandain (Diamond Light Source) , K. Sawhney (Diamond Light Source) , Paul Seller (STFC) , Mattew C. Veale (STFC)
Co-authored by industrial partner: No

Type: Conference Paper
Conference: 12th International Conference on Synchrotron Radiation Instrumentation (SRI2015)
Peer Reviewed: No

State: Published (Approved)
Published: November 2016

Abstract: A novel, “single-shot” fluorescence imaging technique has been demonstrated on the B16 beamline at the Diamond Light Source synchrotron using the HEXITEC energy dispersive imaging detector. A custom made furnace with 200µm thick metal alloy samples was positioned in a white X-ray beam with a hole made in the furnace walls to allow the transmitted beam to be imaged with a conventional X-ray imaging camera consisting of a 500 µm thick single crystal LYSO scintillator, mirror and lens coupled to an AVT Manta G125B CCD sensor. The samples were positioned 45° to the incident beam to enable simultaneous transmission and fluorescence imaging. The HEXITEC detector was positioned at 90° to the sample with a 50 µm pinhole 13cm from the sample and the detector positioned 2.3m from pinhole. The geometric magnification provided a field of view of 1.1×1.1mm2 with one of the 80×80 pixels imaging an area equivalent to 13µm2. Al-Cu alloys doped with Zr, Ag and Mo were imaged in transmission and fluorescence mode. The fluorescence images showed that the dopant metals could be simultaneously imaged with sufficient counts on all 80x80 pixels within 60s, with the X-ray flux limiting the fluorescence imaging rate. This technique demonstrated that it is possible to simultaneously image and identify multiple elements on a spatial resolution scale ~10µm or higher without the time consuming need to scan monochromatic energies or raster scan a focused beam of X-rays. Moving to high flux beamlines and using an array of detectors could improve the imaging speed of the technique with element specific imaging estimated to be on a 1s timescale.

Subject Areas: Technique Development, Physics


Technical Areas: Optics