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Development of a speckle-based portable device for in situ metrology of synchrotron X-ray mirrors

DOI: 10.1107/S1600577516012509 DOI Help

Authors: Yogesh Kashyap (Diamond Light Source) , Hongchang Wang (Diamond Light Source) , Kawal Sawhney (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Synchrotron Radiation , VOL 23 , PAGES 1131 - 1136

State: Published (Approved)
Published: September 2016

Open Access Open Access

Abstract: A portable device for in situ metrology of synchrotron X-ray mirrors based on the near-field speckle scanning technique has been developed. Ultra-high angular sensitivity is achieved by scanning a piece of abrasive paper or filter membrane in the X-ray beam. In addition to the compact setup and ease of implementation, a user-friendly graphical user interface has been developed to ensure that optimizing active X-ray mirrors is simple and fast. The functionality and feasibility of this device have been demonstrated by characterizing and optimizing X-ray mirrors.

Journal Keywords: speckle; X-ray optics; metrology.

Subject Areas: Technique Development, Physics


Instruments: B16-Test Beamline

Added On: 11/11/2016 13:24

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