Article Metrics


Online attention

Probing the deformation and fracture properties of Cu/W nano-multilayers by in situ SEM and synchrotron XRD strain microscopy

DOI: 10.1016/j.surfcoat.2017.01.065 DOI Help

Authors: Leon Romano Brandt (University of Oxford) , Enrico Salvati (University of Oxford) , Chrysanthi Papadaki (University of Oxford) , Hongjia Zhang (University of Oxford) , Siqi Ying (University of Oxford) , Eric Le Bourhis (Université de Poitiers) , Igor Dolbnya (Diamond Light Source) , Tan Sui (University of Oxford) , Alexander M. Korsunsky (University of Oxford)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Surface And Coatings Technology

State: Published (Approved)
Published: January 2017

Abstract: When thin metallic multilayers deposited on a compliant polymer substrate are subjected to stretching, a “brick wall” fracture pattern arises that is associated with a non-uniform two-dimensional stress-strain state evolving as a function of the underlying substrate stretch. The present study is devoted to in situ mechanical microscopy of strain states in a copper/tungsten 18/6 nm multilayer using the combination of scanning synchrotron X-Ray diffraction microscopy and scanning electron microscopy, coupled with Digital Image Correlation. We demonstrate that these methods allow spatial variation of the coating strain to be mapped and compared with theoretical predictions based on shear lag theory, allowing the fracture properties of the multilayer to be extracted.

Journal Keywords: Mechanical microscopy; Shear lag model; in situ strain mapping; X-ray diffraction; Nano-multilayer

Subject Areas: Engineering, Materials

Instruments: B16-Test Beamline

Added On: 23/01/2017 09:23

Discipline Tags:

Materials Engineering & Processes Materials Science Engineering & Technology

Technical Tags: