MHz rate X-Ray imaging with GaAs:Cr sensors using the LPD detector system

DOI: 10.1088/1748-0221/12/02/P02015

Authors: M. C. Veale (Rutherford Appleton Laboratory, Science & Technology Facilities Council) , P. Booker (Rutherford Appleton Laboratory, Science & Technology Facilities Council) , B. Cline (Rutherford Appleton Laboratory, Science & Technology Facilities Council) , J. Coughlan (Rutherford Appleton Laboratory, Science & Technology Facilities Council) , M. Hart (Rutherford Appleton Laboratory, Science & Technology Facilities Council) , T. Nicholls (Rutherford Appleton Laboratory, Science & Technology Facilities Council) , A. Schneider (Rutherford Appleton Laboratory, Science & Technology Facilities Council) , P. Seller (Rutherford Appleton Laboratory, Science & Technology Facilities Council) , I. Pape (Diamond Light Source) , K. Sawhney (Diamond Light Source) , A. D. Lozinskaya (Tomsk State University) , V. A. Novikov (Tomsk State University) , O. P. Tolbanov (Tomsk State University) , A. Tyazhev (Tomsk State University) , A. N. Zarubin (Tomsk State University)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Instrumentation , VOL 12 , PAGES P02015 - P02015

State: Published (Approved)
Published: February 2017
Diamond Proposal Number(s): 13413

Abstract: The STFC Rutherford Appleton Laboratory (U.K.) and Tomsk State University (Russia) have been working together to develop and characterise detector systems based on chromium-compensated gallium arsenide (GaAs:Cr) semiconductor material for high frame rate X-ray imaging. Previous work has demonstrated the spectroscopic performance of the material and its resistance to damage induced by high fluxes of X-rays. In this paper, recent results from experiments at the Diamond Light Source Synchrotron have demonstrated X-ray imaging with GaAs:Cr sensors at a frame rate of 3.7 MHz using the Large Pixel Detector (LPD) ASIC, developed by STFC for the European XFEL. Measurements have been made using a monochromatic 20 keV X-ray beam delivered in a single hybrid pulse with an instantenous flux of up to ~ 1 × 1010 photons s−1 mm−2. The response of 500 μm GaAs:Cr sensors is compared to that of the standard 500 μm thick LPD Si sensors.

Journal Keywords: Hybrid detectors; Instrumentation for FEL; Solid state detectors; X-ray detectors

Subject Areas: Physics


Instruments: B16-Test Beamline

Added On: 16/03/2017 08:47

Discipline Tags:

Detectors Engineering & Technology

Technical Tags:

Diffraction