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Morphology development in solution-processed functional organic blend films: an in situ viewpoint

DOI: 10.1021/acs.chemrev.6b00618 DOI Help

Authors: Lee J. Richter (National Institute of Standards and Technology) , Dean M. Delongchamp (National Institute of Standards and Technology) , Aram Amassian (King Abdullah University of Science and Technology (KAUST))
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Chemical Reviews

State: Published (Approved)
Published: April 2017

Abstract: Solution-processed organic films are a facile route to high-speed, low cost, large-area deposition of electrically functional components (transistors, solar cells, emitters, etc.) that can enable a diversity of emerging technologies, from Industry 4.0, to the Internet of things, to point-of-use heath care and elder care. The extreme sensitivity of the functional performance of organic films to structure and the general nonequilibrium nature of solution drying result in extreme processing–performance correlations. In this Review, we highlight insights into the fundamentals of solution-based film deposition afforded by recent state-of-the-art in situ measurements of functional film drying. Emphasis is placed on multimodal studies that combine surface-sensitive X-ray scattering (GIWAXS or GISAXS) with optical characterization to clearly define the evolution of solute structure (aggregation, crystallinity, and morphology) with film thickness.

Journal Keywords: Thickness; Coating materials; Additives; Organic polymers; Solvents

Diamond Keywords: Additive Manufacturing

Subject Areas: Materials, Chemistry


Instruments: NONE-No attached Diamond beamline

Other Facilities: European Synchrotron Radiation Facility; Advanced Light Source; Cornell High Energy Synchrotron Source

Added On: 24/04/2017 10:31

Discipline Tags:

Energy Materials Chemistry Materials Science Organic Chemistry

Technical Tags:

Scattering Wide Angle X-ray Scattering (WAXS) Grazing Incidence Wide Angle Scattering (GIWAXS)