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Probing Deformation Substructure by Synchrotron X-ray Diffraction and Dislocation Dynamics Modelling

DOI: 10.1166/jnn.2010.2558 DOI Help
PMID: 21133131 PMID Help

Authors: Alexander Korsunsky (University of Oxford) , Felix Hofmann (University of Oxford) , Xu Song (Singapore Institute of Manufacturing Technology) , Sophie Eve (CRISMAT ENSICAEN) , Steve Collins (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Nanoscience And Nanotechnology , VOL 10 (9) , PAGES 5935-5950

State: Published (Approved)
Published: September 2010

Abstract: Materials characterization at the nano-scale is motivated by the desire to resolve the structural aspects and deformation behavior at length scales relevant to those mechanisms that define the novel and unusual properties of nano-structured materials. A range of novel techniques has recently become accessible with the help of synchrotron X-ray beams that can be focused down to spot sizes of less than a few microns on the sample. The unique combination of tunability (energy selection), parallelism and brightness of synchrotron X-ray beams allows their use for high resolution diffraction (determination of crystal structure and transformations, analysis of dislocation sub-structures, orientation and texture analysis, strain mapping); small angle X-ray scattering (analysis of nano-scale voids and defects; orientation analysis) and imaging (radiography and tomography). After a brief review of the state-of-the-art capabilities for monochromatic and white beam synchrotron diffraction, we consider the usefulness of these techniques for the task of bridging the gap between experiment and modeling. Namely, we discuss how the experiments can be configured to provide information relevant to the validation and improvement of modeling approaches, and also how the results of various simulations can be post-processed to improve the possibility of (more or less) direct comparison with experiments. Using the example of some recent experiments carried out on beamline I16 at Diamond Light Source near Oxford, we discuss how such experimental results can be interpreted in view and in conjunction with numerical deformation models, particularly those incorporating dislocation effects, e.g., finite-element based pseudo-continuum strain gradient formulations, and discrete dislocation simulations. Post-processing of FE and discrete dislocation simulations is described, illustrating the kind of information that can be extracted from comparisons between modeling and experimental data.

Journal Keywords: Deformation; Diffraction; Dislocations; Reciprocal Space Mapping

Subject Areas: Materials, Physics


Instruments: I16-Materials and Magnetism