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Ptychographic imaging for the characterization of X-ray free-electron laser beams

DOI: 10.1088/1742-6596/849/1/012032 DOI Help

Authors: S. Sala (University College London (UCL); DIamond Light Source; University of Southampton) , B. J. Daurer (Uppsala University) , M. F. Hantke (Uppsala University) , T. Ekeberg (Uppsala University) , N. D. Loh (University of Singapore) , F. R. N. C. Maia (Uppsala University) , P. Thibault (University of Southampton)
Co-authored by industrial partner: No

Type: Conference Paper
Conference: X-Ray Microscopy Conference 2016
Peer Reviewed: No

State: Published (Approved)
Published: June 2017

Open Access Open Access

Abstract: We present some preliminary results from a study aimed at the characterization of the wavefront of X-ray free electron laser (XFEL) beams in the same operation conditions as for single particle imaging (or flash X-ray imaging) experiments. The varying illumination produced by wavefront fluctuations between several pulses leads to a partially coherent average beam which can be decomposed into several coherent modes using ptychographic reconstruction algorithms. Such a decomposition can give insight into pulse-to-pulse variations of the wavefront. We discuss data collected at the Linac Coherent Light Source (LCLS) and FERMI.

Subject Areas: Technique Development, Physics


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Added On: 29/06/2017 09:56

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