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Best practices for managing large CryoEM facilities
DOI:
10.1016/j.jsb.2017.07.011
Authors:
Bart
Alewijnse
(NeCEN, Leiden University)
,
Alun W.
Ashton
(Diamond Light Source)
,
Melissa G.
Chambers
(Harvard Medical School)
,
Songye
Chen
(California Institute of Technology)
,
Anchi
Cheng
(New York Structural Biology Center)
,
Mark
Ebrahim
(The Rockefeller University)
,
Edward T.
Eng
(New York Structural Biology Center)
,
Wim J. H.
Hagen
(EMBL Heidelberg)
,
Abraham J.
Koster
(NeCEN, Leiden University)
,
Claudia S.
López
(Oregon Health & Science University)
,
Natalya
Lukoyanova
(ISMB/Birkbeck)
,
Joaquin
Ortega
(McGill University)
,
Ludovic
Renault
(NeCEN, Leiden University)
,
Steve
Reyntjens
(FEI Company/Thermo Fisher Scientific)
,
William J.
Rice
(New York Structural Biology Center)
,
Giovanna
Scapin
(Merck & Co, Inc)
,
Raymond
Schrijver
(FEI Company/Thermo Fisher Scientific)
,
Alistair
Siebert
(Diamond Light Source)
,
Scott M.
Stagg
(Florida State University)
,
Valerie
Grum-tokars
(Northwestern University)
,
Elizabeth R.
Wright
(Emory University)
,
Shenping
Wu
(Yale University)
,
Zhiheng
Yu
(HHMI Janelia Research Campus)
,
Z. Hong
Zhou
(University of California)
,
Bridget
Carragher
(New York Structural Biology Center)
,
Clinton S.
Potter
(New York Structural Biology Center)
Co-authored by industrial partner:
No
Type:
Journal Paper
Journal:
Journal Of Structural Biology
State:
Published (Approved)
Published:
August 2017
Abstract: This paper provides an overview of the discussion and presentations from the Workshop on the Management of Large CryoEM Facilities held at the New York Structural Biology Center, New York, NY on February 6–7, 2017. A major objective of the workshop was to discuss best practices for managing cryoEM facilities. The discussions were largely focused on supporting single-particle methods for cryoEM and topics included: user access, assessing projects, workflow, sample handling, microscopy, data management and processing, and user training.
Journal Keywords: Cryotem; Automation; Facility management; User training; Single-particle; Data management
Subject Areas:
Technique Development
Technical Areas: