Publication
Article Metrics
Citations
Online attention
Speckle-based portable device for in-situ metrology of x-ray mirrors at Diamond Light Source
Authors:
Hongchang
Wang
(Diamond Light Source)
,
Tunhe
Zhou
(Diamond Light Source)
,
Yogesh
Kashyap
(Diamond Light Source)
,
Kawal
Sawhney
(Diamond Light Source)
Co-authored by industrial partner:
No
Type:
Conference Paper
Conference:
SPIE Optical Engineering + Applications, 2017
Peer Reviewed:
No
State:
Published (Approved)
Published:
September 2017
Diamond Proposal Number(s):
14242

Abstract: For modern synchrotron light sources, the push toward diffraction-limited and coherence-preserved beams demands accurate metrology on X-ray optics. Moreover, it is important to perform in-situ characterization and optimization of X-ray mirrors since their ultimate performance is critically dependent on the working conditions. Therefore, it is highly desirable to develop a portable metrology device, which can be easily implemented on a range of beamlines for in-situ metrology. An X-ray speckle-based portable device for in-situ metrology of synchrotron X-ray mirrors has been developed at Diamond Light Source. Ultra-high angular sensitivity is achieved by scanning the speckle generator in the X-ray beam. In addition to the compact setup and ease of implementation, a user-friendly graphical user interface has been developed to ensure that characterization and alignment of X-ray mirrors is simple and fast. The functionality and feasibility of this device is presented with representative examples.
Subject Areas:
Technique Development,
Physics
Instruments:
B16-Test Beamline
Documents:
1038504.pdf