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Speckle-based portable device for in-situ metrology of x-ray mirrors at Diamond Light Source

DOI: 10.1117/12.2274780 DOI Help

Authors: Hongchang Wang (Diamond Light Source) , Tunhe Zhou (Diamond Light Source) , Yogesh Kashyap (Diamond Light Source) , Kawal Sawhney (Diamond Light Source)
Co-authored by industrial partner: No

Type: Conference Paper
Conference: SPIE Optical Engineering + Applications, 2017
Peer Reviewed: No

State: Published (Approved)
Published: September 2017
Diamond Proposal Number(s): 14242

Open Access Open Access

Abstract: For modern synchrotron light sources, the push toward diffraction-limited and coherence-preserved beams demands accurate metrology on X-ray optics. Moreover, it is important to perform in-situ characterization and optimization of X-ray mirrors since their ultimate performance is critically dependent on the working conditions. Therefore, it is highly desirable to develop a portable metrology device, which can be easily implemented on a range of beamlines for in-situ metrology. An X-ray speckle-based portable device for in-situ metrology of synchrotron X-ray mirrors has been developed at Diamond Light Source. Ultra-high angular sensitivity is achieved by scanning the speckle generator in the X-ray beam. In addition to the compact setup and ease of implementation, a user-friendly graphical user interface has been developed to ensure that characterization and alignment of X-ray mirrors is simple and fast. The functionality and feasibility of this device is presented with representative examples.

Subject Areas: Technique Development, Physics


Instruments: B16-Test Beamline

Documents:
1038504.pdf