Publication
Article Metrics
Citations
Online attention
Pr[sub 2]O[sub 3] on Si(001): A commensurate interfacial layer overgrown by silicate
Authors:
L.
Libralesso
(ESRF, France)
,
T.-l.
Lee
(Diamond Light Source)
,
J.
Zegenhagen
(ESRF, France)
Co-authored by industrial partner:
No
Type:
Journal Paper
Journal:
Applied Physics Letters
, VOL 90 (22)
State:
Published (Approved)
Published:
May 2007
Abstract: The growth of Pr2O3 on Si(001) for film thicknesses up to 3 nm was studied in situ in ultrahigh vacuum without exposure to ambient by x-ray reflectivity, grazing incident x-ray diffraction, and angle-resolved x-ray photoelectron spectroscopy using synchrotron radiation. The electron density and chemical composition profiles as well as the in-plane superstructure deduced from the present analysis reveal the development of a 0.5 nm thick transition layer at the interface that exhibits a cubic Pr2O3 structure and is commensurate to the Si substrate. This layer is overgrown by disordered Pr silicate.
Journal Keywords: Ozone; Interface structure; Reflectivity; X-ray photoelectron spectroscopy; Crystal structure
Subject Areas:
Physics
Facility: ESRF