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Probing Dielectric Properties of Metal-Organic Frameworks: MIL‑53(Al) as a Model System for Theoretical Predictions and Experimental Measurements via Synchrotron Far- and Mid-InfraRed Spectroscopy

DOI: 10.1021/acs.jpclett.7b02003 DOI Help

Authors: Kirill Titov (University of Oxford) , Zhixin Zeng (University of Oxford) , Matthew R. Ryder (University of Oxford) , Abhijeet K. Chaudhari (University of Oxford) , Bartolomeo Civalleri (University of Turin) , Chris S. Kelley (Diamond Light Source) , Mark D. Frogley (Diamond Light Source) , Gianfelice Cinque (Diamond Light Source) , Jin-chong Tan (University of Oxford)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: The Journal Of Physical Chemistry Letters

State: Published (Approved)
Published: September 2017
Diamond Proposal Number(s): 14902

Abstract: Emerging nanoporous materials, such as metal-organic frameworks (MOFs), are promising low-k dielectrics central to next-generation electronics and high-speed communication. Hitherto, the dielectric characterization of MOFs is scarce, with very limited experimental data for guiding new materials design and synthesis. Herein we demonstrate the efficacy of high-resolution synchrotron infrared (IR) specular reflectance experiments, to study the dynamic dielectric properties of a flexible MOF structure: bi-stable MIL-53(Al) that exhibits switching between a large pore (LP) and a narrow pore (NP) architecture. We show the ratio of LP:NP content of a polycrystalline sample can be changed via increased mechanical stress applied for pelletizing the MIL-53(Al) powder. We quantify the frequency-dependent dielectric constants over ~1 to 120 THz, identifying all dielectric transitions as a function of stress and phase mixtures, showing how porosity modifies MOF’s dielectric properties.

Subject Areas: Chemistry, Physics


Instruments: B22-Multimode InfraRed imaging And Microspectroscopy