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MINERVA: A facility to study Microstructure and INterface Evolution in Realtime under VAcuum

DOI: 10.1063/1.4989761 DOI Help

Authors: Chris Nicklin (Diamond Light Source) , Josue Martinez-hardigree (University of Oxford) , Adam Warne (Diamond Light Source) , Stephen Green (Diamond Light Source) , Martin Burt (Diamond Light Source) , John Naylor (Kurt J. Lesker Company) , Adam Dorman (Kurt J. Lesker Company) , Dean Wicks (Kurt J. Lesker Company) , Salahud Din (Kurt J. Lesker Company) , Moritz Riede (University of Oxford)
Co-authored by industrial partner: Yes

Type: Journal Paper
Journal: Review Of Scientific Instruments , VOL 88

State: Published (Approved)
Published: October 2017
Diamond Proposal Number(s): 14220 , 15207

Open Access Open Access

Abstract: A sample environment to enable real-time X-ray scattering measurements to be recorded during the growth of materials by thermal evaporation in vacuum is presented. The in situ capabilities include studying microstructure development with time or during exposure to different environmental conditions, such as temperature and gas pressure. The chamber provides internal slits and a beam stop, to reduce the background scattering from the X-rays passing through the entrance and exit windows, together with highly controllable flux rates of the evaporants. Initial experiments demonstrate some of the possibilities by monitoring the growth of bathophenanthroline (BPhen), a common molecule used in organic solar cells and organic light emitting diodes, including the development of the microstructure with time and depth within the film. The results show how BPhen nanocrystal structures coarsen at room temperature under vacuum, highlighting the importance of using real time measurements to understand the as-deposited pristine film structure and its development with time. More generally, this sample environment is versatile and can be used for investigation of structure-property relationships in a wide range of vacuum deposited materials and their applications in, for example, optoelectronic devices and energy storage.

Journal Keywords: Thin film deposition; Light emitting diodes; Optoelectronic devices; Optical metrology; Solar cells

Subject Areas: Materials, Physics, Technique Development


Instruments: I07-Surface & interface diffraction

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