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Accurate evaluation of abberration for probe-forming system and influence of aberration on high-resolution STEM image

DOI: 10.1088/1742-6596/902/1/012012 DOI Help

Authors: Hidetaka Sawada (Diamond Light Source; University of Oxford; JEOL UK Ltd) , Fumio Hosokawa (BioNet Laboratory Inc.) , Angus I. Kirkland (Diamond Light Source; University of Oxford)
Co-authored by industrial partner: No

Type: Conference Paper
Conference: Electron Microscopy and Analysis Group Conference 2017 (EMAG2017)
Peer Reviewed: No

State: Published (Approved)
Published: September 2017

Open Access Open Access

Abstract: The influence of residual three-fold astigmatism on high-resolution STEM imaging of graphene has been investigated. The aberration was measured by the segmented Ronchigram auto-correlation function method using the graphene lattice. In the presence of residual threefold astigmatism the graphene lattice showed a lower three-fold rotational symmetry where three C atoms in the six membered ring had a higher intensity.

Subject Areas: Physics, Materials

Diamond Offline Facilities: Electron Physical Sciences Imaging Center (ePSIC)
Instruments: E02-JEM ARM 300CF

Added On: 24/10/2017 11:55


Discipline Tags:

Physics Materials Science

Technical Tags:

Microscopy Electron Microscopy (EM) Scanning Transmission Electron Microscopy (STEM)