Publication

Article Metrics

Citations


Online attention

Accurate Evaluation of Aberration for Probe-Forming System and Influence of Aberration on High-Resolution STEM image

DOI: 10.1088/1742-6596/902/1/012012 DOI Help

Authors: Hidetaka Sawada (Diamond Light Source; University of Oxford; JEOL UK Ltd) , Fumio Hosokawa (BioNet Laboratory Inc.) , Angus I. Kirkland (Diamond Light Source; University of Oxford)
Co-authored by industrial partner: No

Type: Conference Paper
Conference: Electron Microscopy and Analysis Group Conference 2017 (EMAG2017)
Peer Reviewed: No

State: Published (Approved)
Published: September 2017

Open Access Open Access

Abstract: The influence of residual three-fold astigmatism on high-resolution STEM imaging of graphene has been investigated. The aberration was measured by the segmented Ronchigram auto-correlation function method using the graphene lattice. In the presence of residual threefold astigmatism the graphene lattice showed a lower three-fold rotational symmetry where three C atoms in the six membered ring had a higher intensity.

Subject Areas: Physics

Diamond Offline Facilities: Electron Physical Sciences Imaging Center (ePSIC)
Instruments: E02-JEM ARM 300CF

Documents:
p3455df.pdf