Measurement of off-axial aberration

DOI: 10.1088/1742-6596/902/1/012011

Authors: Hidetaka Sawada (Diamond Light Source; University of Oxford) , Angus I. Kirkland (Diamond Light Source; University of Oxford)
Co-authored by industrial partner: No

Type: Conference Paper
Conference: Electron Microscopy and Analysis Group Conference 2017 (EMAG2017)
Peer Reviewed: No

State: Published (Approved)
Published: September 2017

Abstract: High-resolution observation of a large field of view with a high quality detector is important for single particle analysis or in-situ experiments. Consequently, evaluation of aberrations that depend on position in the field of view, (off-axial aberrations) is required. We report the experimental measurement of off-axial aberrations including higher order components in several optical conditions together with the corresponding off-axial phase maps.

Subject Areas: Physics

Diamond Offline Facilities: Electron Physical Sciences Imaging Center (ePSIC)
Instruments: E02-JEM ARM 300CF

Added On: 24/10/2017 12:20

Documents:
p34656df.pdf

Discipline Tags:

Detectors Physics Engineering & Technology

Technical Tags:

Microscopy Electron Microscopy (EM) Transmission Electron Microscopy (TEM)