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Measurement of off-axial aberration
DOI:
10.1088/1742-6596/902/1/012011
Authors:
Hidetaka
Sawada
(Diamond Light Source; University of Oxford)
,
Angus I.
Kirkland
(Diamond Light Source; University of Oxford)
Co-authored by industrial partner:
No
Type:
Conference Paper
Conference:
Electron Microscopy and Analysis Group Conference 2017 (EMAG2017)
Peer Reviewed:
No
State:
Published (Approved)
Published:
September 2017

Abstract: High-resolution observation of a large field of view with a high quality detector is important for single particle analysis or in-situ experiments. Consequently, evaluation of aberrations that depend on position in the field of view, (off-axial aberrations) is required. We report the experimental measurement of off-axial aberrations including higher order components in several optical conditions together with the corresponding off-axial phase maps.
Subject Areas:
Physics
Diamond Offline Facilities:
Electron Physical Sciences Imaging Center (ePSIC)
Instruments:
E02-JEM ARM 300CF
Added On:
24/10/2017 12:20
Documents:
p34656df.pdf
Discipline Tags:
Detectors
Physics
Engineering & Technology
Technical Tags:
Microscopy
Electron Microscopy (EM)
Transmission Electron Microscopy (TEM)