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Electron ptychographic microscopy for three-dimensional imaging

DOI: 10.1038/s41467-017-00150-1 DOI Help

Authors: Si Gao (Nanjing University) , Peng Wang (Nanjing University) , Fucai Zhang (Southern University of Science and Technology; London Centre for Nanotechnology; Research Complex at Harwell) , Gerardo T. Martinez (University of Oxford) , Peter D. Nellist (University of Oxford) , Xiaoqing Pan (Nanjing University; University of California) , Angus I. Kirkland (University of Oxford; Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Nature Communications , VOL 8

State: Published (Approved)
Published: July 2017

Open Access Open Access

Abstract: Knowing the three-dimensional structural information of materials at the nanometer scale is essential to understanding complex material properties. Electron tomography retrieves three-dimensional structural information using a tilt series of two-dimensional images. In this paper, we report an alternative combination of electron ptychography with the inverse multislice method. We demonstrate depth sectioning of a nanostructured material into slices with 0.34 nm lateral resolution and with a corresponding depth resolution of about 24–30 nm. This three-dimensional imaging method has potential applications for the three-dimensional structure determination of a range of objects, ranging from inorganic nanostructures to biological macromolecules.

Journal Keywords: Imaging techniques; Transmission electron microscopy

Subject Areas: Materials


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