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Aberration correction for hard x-ray focusing at the nanoscale

DOI: 10.1117/12.2274030 DOI Help

Authors: Jussi Rahomaki (KTH Royal Institute of Technology) , Ulrich Wagner (Diamond Light Source) , Frank Seiboth (Deutsches Elektronen-Synchrotron) , Andreas Schropp (Deutsches Elektronen-Synchrotron) , Maria Scholz (Deutsches Elektronen-Synchrotron DESY) , Felix Wittwer (Deutsches Elektronen-Synchrotron) , Christian Rödel (SLAC National Accelerator Lab.) , Martin Wünsche (Friedrich-Schiller-Univ. Jena) , Tobias Ullsperger (Friedrich-Schiller-Univ. Jena) , Stefan Nolte (Friedrich-Schiller-Univ. Jena) , Karolis Parfeniukas (KTH Royal Institute of Technology) , Stylianos Giakoumidis (KTH Royal Institute of Technology) , Ulrich Vogt (KTH Royal Institute of Technology) , Christoph Rau (Diamond Light Source) , Ulrike Boesenberg (Deutsches Elektronen-Synchrotron) , Jan Garrevoet (Deutsches Elektronen-Synchrotron) , Gerald Falkenberg (Deutsches Elektronen-Synchrotron) , Eric C. Galtier (SLAC National Accelerator Lab.) , Hae Ja Lee (SLAC National Accelerator Lab.) , Bob Nagler (SLAC National Accelerator Lab.) , Christian G. Schroer (Deutsches Elektronen-Synchrotron)
Co-authored by industrial partner: No

Type: Conference Paper
Conference: SPIE Optical Engineering + Applications, 2017
Peer Reviewed: No

State: Published (Approved)
Published: August 2017

Abstract: We developed a corrective phase plate that enables the correction of residual aberration in reflective, diffractive, and refractive X-ray optics. The principle is demonstrated on a stack of beryllium compound refractive lenses with a numerical aperture of 0.49 10-3 at three synchrotron radiation and x-ray free-electron laser facilities, where we corrected spherical aberration of the optical system. The phase plate improved the Strehl ratio of the optics from 0.29(7) to 0.87(5), creating a diffraction-limited, large aperture, nanofocusing optics that is radiation resistant and very compact.

Journal Keywords: x-ray optics; compound refractive lenses; aberration correction; ptychography; wavefront sensing

Subject Areas: Technique Development


Instruments: I13-1-Coherence

Other Facilities: DESY