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Characterization of thin film displacements in the electron microscope
Authors:
Hidetaka
Sawada
(Diamond Light Source; University of Oxford; JEOL UK Ltd)
,
Reiner
Ramlau
(Max-Planck-Institut f€ur Chemische Physik fester Stoffe)
,
Christopher S.
Allen
(Diamond Light Source; University of Oxford)
,
Angus I.
Kirkland
(University of Oxford; Diamond Light Source)
Co-authored by industrial partner:
No
Type:
Journal Paper
Journal:
Applied Physics Letters
, VOL 111
State:
Published (Approved)
Published:
November 2017
Diamond Proposal Number(s):
16972
Abstract: It is important to characterize behavior along the normal (z) direction to the plane of a thin film to enable three-dimensional reconstruction at atomic-resolution. In this study, we have investigated displacements of a specimen along the z direction using dark field high angle annular dark field STEM images of single atoms as a function of specimen tilt. These showed an elongation perpendicular to the tilt axis. Experimental measurements of the contrast of single atoms indicate fluctuations in the film along the z direction with a displacement amplitude of 0.6 nm.
Subject Areas:
Technique Development,
Physics
Diamond Offline Facilities:
Electron Physical Sciences Imaging Center (ePSIC)
Instruments:
E02-JEM ARM 300CF