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The modular small-angle X-ray scattering data correction sequence

DOI: 10.1107/S1600576717015096 DOI Help

Authors: B. R. Pauw (Bundesanstalt für Materialforschung und -prüfung) , A. J. Smith (Diamond Light Source) , T. Snow (Diamond Light Source) , N. J. Terrill (Diamond Light Source) , A. F. Thünemann (Bundesanstalt für Materialforschung und -prüfung)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Applied Crystallography , VOL 50 , PAGES 1800 - 1811

State: Published (Approved)
Published: December 2017

Open Access Open Access

Abstract: Data correction is probably the least favourite activity amongst users experimenting with small-angle X-ray scattering: if it is not done sufficiently well, this may become evident only during the data analysis stage, necessitating the repetition of the data corrections from scratch. A recommended comprehensive sequence of elementary data correction steps is presented here to alleviate the difficulties associated with data correction, both in the laboratory and at the synchrotron. When applied in the proposed order to the raw signals, the resulting absolute scattering cross section will provide a high degree of accuracy for a very wide range of samples, with its values accompanied by uncertainty estimates. The method can be applied without modification to any pinhole-collimated instruments with photon-counting direct-detection area detectors.

Journal Keywords: small-angle scattering; accuracy; methodology; data correction.

Subject Areas: Technique Development, Physics


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