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RASOR: An advanced instrument for soft x-ray reflectivity and diffraction

DOI: 10.1063/1.3458004 DOI Help

Authors: T. Beale (University of Durham) , T. P. A. Hase (University of Warwick) , T. Iida (Toyama Co. Ltd) , K. Endo (Toyama Co. Ltd) , P. Steadman (Diamond Light Source) , A. Marshall (Diamond Light Source) , S. Dhesi (Diamond Light Source) , G. Van Der Laan (Diamond Light Source) , P. Hatton (University of Durham)
Co-authored by industrial partner: Yes

Type: Journal Paper
Journal: Review Of Scientific Instruments , VOL 81 (7) , PAGES 073904

State: Published (Approved)
Published: July 2010

Abstract: 10.1063/1.3458004 We report the design and construction of a novel soft x-raydiffractometer installed at Diamond Light Source. The beamline endstation RASOR is constructed for general users and designed primarily for the study of single crystal diffraction and thin film reflectivity. The instrument is comprised of a limited three circle (θ , 2θ , and χ ) diffractometer with an additional removable rotation (ϕ) stage. It is equipped with a liquid helium cryostat, and post-scatter polarization analysis. Motorized motions are provided for the precise positioning of the sample onto the diffractometer center of rotation, and for positioning the center of rotation onto the x-ray beam. The functions of the instrument have been tested at Diamond Light Source, and initial test measurements are provided, demonstrating the potential of the instrument.

Journal Keywords: Polarization; X-Ray Diffraction; X-Ray Scattering; Reflectivity; Soft X-Rays

Subject Areas: Technique Development


Instruments: I06-Nanoscience

Added On: 13/07/2010 08:34

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