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Analysis of triple phase contact in Ni–YSZ microstructures using non-destructive X-ray tomography with synchrotron radiation

DOI: 10.1016/j.elecom.2010.05.014 DOI Help

Authors: P. R. Shearing (University College London) , J. Gelb (Xradia Inc) , J. Yi (Advanced Photon Source, Argonne National Lab) , W-k Lee (Advanced Photon Source, Argonne National Lab) , M. Drakopoulos (Diamond Light Source) , N. P. Brandon (Imperial College London, UK)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Electrochemistry Communications , VOL 12 (8) , PAGES 1021-1024

State: Published (Approved)
Published: August 2010

Abstract: Here, we demonstrate the use of X-ray absorption edge spectroscopy in conjunction with high resolution X-ray nano-computed tomography to provide a comprehensive microstructural map of a Ni–YSZ electrode from a Solid Oxide Fuel Cell. The experimentally derived microstructure has been used to develop a geometrical test for microstructural homogeneity.

Journal Keywords: Tomography; Solid Oxide Fuel Cell; Synchrotron

Subject Areas: Chemistry

Facility: APS

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