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Coherent x-ray diffraction imaging of grown-in antiphase boundaries in Fe(65)Al(35)

DOI: 10.1103/PhysRevB.76.014204 DOI Help

Authors: Lorenze-m. Stadler (Universität Wien) , Ross Harder (London Centre for Nanotechnology and Department of Physics and Astronomy) , Ian K. Robinson (Diamond Light Source) , Christian Rentenberger (Universität Wien) , H.-peter Karnthaler (Universität Wien) , Bogdan Sepiol (Universität Wien) , Gero Vogl (Universität Wien)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Physical Review B , VOL 76

State: Published (Approved)
Published: July 2007

Abstract: Coherent x-ray diffraction has been used to image grown in antiphase boundaries (APBs) in a metal alloy, which represent pure phase objects. The fine structure within the (001) superstructure diffraction peak of a B2-ordered bulk Fe(65)Al(35) sample was inverted by means of iterative algorithms that Fourier transform between reciprocal and real space, applying appropriate constraints in each domain. Since the sample object is non-compact, bigger than the beam footprint, knowing the precise beam profile was essential to define the real space constraint. Even though a unique long range structure could not be derived, the algorithm found phase structures that were locally unique. These were identified in all reconstruction runs by means of a cross-correlation analysis. The obtained characteristic APB morphology is confirmed by transmission electron microscopy results from the same sample, revealing nearly planar APB walls on (110) planes terminating at grown-in dislocations.

Subject Areas: Physics

Facility: APS