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State of the art of X-ray speckle-based phase-contrast and dark-field imaging

DOI: 10.3390/jimaging4050060 DOI Help

Authors: Marie-Christine Zdora (Diamond Light Source; University College London)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Imaging , VOL 4

State: Published (Approved)
Published: April 2018

Open Access Open Access

Abstract: In the past few years, X-ray phase-contrast and dark-field imaging have evolved to be invaluable tools for non-destructive sample visualisation, delivering information inaccessible by conventional absorption imaging. X-ray phase-sensing techniques are furthermore increasingly used for at-wavelength metrology and optics characterisation. One of the latest additions to the group of differential phase-contrast methods is the X-ray speckle-based technique. It has drawn significant attention due to its simple and flexible experimental arrangement, cost-effectiveness and multimodal character, amongst others. Since its first demonstration at highly brilliant synchrotron sources, the method has seen rapid development, including the translation to polychromatic laboratory sources and extension to higher-energy X-rays. Recently, different advanced acquisition schemes have been proposed to tackle some of the main limitations of previous implementations. Current applications of the speckle-based method range from optics characterisation and wavefront measurement to biomedical imaging and materials science. This review provides an overview of the state of the art of the X-ray speckle-based technique. Its basic principles and different experimental implementations as well as the the latest advances and applications are illustrated. In the end, an outlook for anticipated future developments of this promising technique is given.

Journal Keywords: X-ray speckle-based imaging; X-ray near-field speckle; X-ray phase-contrast imaging; X-ray dark-field imaging; X-ray multimodal imaging; X-ray phase tomography; X-ray wavefront sensing; metrology; optics characterisation

Subject Areas: Physics, Technique Development


Technical Areas:

Added On: 03/05/2018 09:31

Discipline Tags:

Physics Technique Development - Physics

Technical Tags: