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Applications of laboratory-based phase-contrast imaging using speckle tracking technique towards high energy x-rays

DOI: 10.3390/jimaging4050069 DOI Help

Authors: Tunhe Zhou (Diamond Light Source) , Fei Yang (Empa, Swiss Federal Laboratories for Materials Science and Technology) , Rolf Kaufmann (Empa, Swiss Federal Laboratories for Materials Science and Technology) , Hongchang Wang (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Imaging , VOL 4

State: Published (Approved)
Published: May 2018

Open Access Open Access

Abstract: The recently developed speckle-based technique is a promising candidate for laboratory-based X-ray phase-contrast imaging due to its compatibility with polychromatic X-rays, multi-modality and flexibility. Previously, successful implementations of the method on laboratory systems have been shown mostly with energies less than 20 keV on samples with materials like soft tissues or polymer. Higher energy X-rays are needed for penetrating materials with a higher atomic number or that are thicker in size. A first demonstration using high energy X-rays was recently given. Here, we present more potential application examples, i.e., a multi-contrast imaging of an IC chip and a phase tomography of a mortar sample, at an average photon energy of 40 keV using a laboratory X-ray tube. We believe the results demonstrate the applicability of this technique in a wide range of fields for non-destructive examination in industry and material science.

Journal Keywords: X-ray imaging; phase contrast; speckle; multi-contrast; tomography; chip; cement

Subject Areas: Physics, Technique Development


Technical Areas: Optics

Documents:
jimaging-04-00069.pdf

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