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Improving the quality of XAFS data

DOI: 10.1107/S1600577518006021 DOI Help

Authors: Hitoshi Abe (High Energy Accelerator Research Organization (KEK)) , Giuliana Aquilanti (Elettra-Sincrotrone Trieste) , Roberto Boada (Diamond Light Source) , Bruce Bunker (University of Notre Dame) , Pieter Glatzel (European Synchrotron Radiation Facility) , Maarten Nachtegaal (Paul Scherrer Institute) , Sakura Pascarelli (European Synchrotron Radiation Facility)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Synchrotron Radiation , VOL 25

State: Published (Approved)
Published: July 2018

Open Access Open Access

Abstract: Following the Q2XAFS Workshop and Satellite to IUCr Congress 2017 on `Data Acquisition, Treatment, Storage – quality assurance in XAFS spectroscopy', a summary is given of the discussion on different aspects of a XAFS experiment that affect data quality. Some pertinent problems ranging from sources and minimization of noise to harmonic contamination and uncompensated monochromator glitches were addressed. Also, an overview is given of the major limitations and pitfalls of a selection of related methods, such as photon-out spectroscopies and energy-dispersive XAFS, and of increasingly common applications, namely studies at high pressure, and time-resolved investigations of catalysts in operando. Advice on how to avoid or deal with these problems and a few good practice recommendations are reported, including how to correctly report results.

Journal Keywords: XAFS; quality of XAFS data; sources of noise in XAFS; harmonic rejection in XAFS; good practice in XAFS experiments

Subject Areas: Technique Development, Physics


Instruments: I20-EDE-Energy Dispersive EXAFS (EDE) , I20-Scanning-X-ray spectroscopy (XAS/XES)

Other Facilities: European Synchrotron Radiation Facility; Photon Factory KEK; Swiss Light Source