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Tunable X-ray speckle-based phase-contrast and dark-field imaging using the unified modulated pattern analysis approach

DOI: 10.1088/1748-0221/13/05/C05005 DOI Help

Authors: M.-c. Zdora (Diamond Light Source; University College London) , P. Thibault (University of Southampton) , H. Deyhle (University of Southampton) , J. Vila-comamala (Institute for Biomedical Engineering, ETH Z├╝rich) , C. Rau (Diamond Light Source; University of Manchester; Northwestern University) , I. Zanette (Diamond Light Source)
Co-authored by industrial partner: No

Type: Conference Paper
Conference: 24th International congress on x-ray optics and microanalysis (ICXOM24)
Peer Reviewed: No

State: Published (Approved)
Published: May 2018
Diamond Proposal Number(s): 18131

Open Access Open Access

Abstract: X-ray phase-contrast and dark-field imaging provides valuable, complementary information about the specimen under study. Among the multimodal X-ray imaging methods, X-ray grating interferometry and speckle-based imaging have drawn particular attention, which, however, in their common implementations incur certain limitations that can restrict their range of applications. Recently, the unified modulated pattern analysis (UMPA) approach was proposed to overcome these limitations and combine grating- and speckle-based imaging in a single approach. Here, we demonstrate the multimodal imaging capabilities of UMPA and highlight its tunable character regarding spatial resolution, signal sensitivity and scan time by using different reconstruction parameters.

Journal Keywords: Inspection with x-rays; Multi-modality systems; X-ray radiography and digital radiography

Subject Areas: Physics, Technique Development
Collaborations: Diamond Manchester

Instruments: I13-2-Diamond Manchester Imaging

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