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X-ray phase-contrast imaging with engineered porous materials over 50 keV

DOI: 10.1107/S1600577518005623 DOI Help

Authors: Hongchang Wang (Diamond Light Source) , Biao Cai (University of Birmingham) , Matthew James Pankhurst (University of Manchester; Research Complex at Harwell; University of Leeds; Instituto Technológico y de Energías Renovables (ITER); Instituto Volcanológico de Canaries (INVOLCAN)) , Tunhe Zhou (Diamond Light Source) , Yogesh Kashyap (Bhabha Atomic Research Centre) , Robert Atwood (Diamond Light Source) , Nolwenn Le Gall (University of Manchester; Research Complex at Harwell) , Peter Lee (University of Manchester; Research Complex at Harwell) , Michael Drakopoulos (Diamond Light Source) , Kawal Sawhney (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Synchrotron Radiation , VOL 25

State: Published (Approved)
Published: July 2018
Diamond Proposal Number(s): 14033

Open Access Open Access

Abstract: X-ray phase-contrast imaging can substantially enhance image contrast for weakly absorbing samples. The fabrication of dedicated optics remains a major barrier, especially in high-energy regions (i.e. over 50 keV). Here, the authors perform X-ray phase-contrast imaging by using engineered porous materials as random absorption masks, which provides an alternative solution to extend X-ray phase-contrast imaging into previously challenging higher energy regions. The authors have measured various samples to demonstrate the feasibility of the proposed engineering materials. This technique could potentially be useful for studying samples across a wide range of applications and disciplines.

Journal Keywords: X-ray phase imaging; speckle technique; hard X-rays; random attenuation masks; high-energy regions; porous materials

Subject Areas: Materials, Technique Development


Instruments: B16-Test Beamline , I12-JEEP: Joint Engineering, Environmental and Processing

Added On: 18/06/2018 08:31

Documents:
hf5358.pdf

Discipline Tags:

Materials Science Technique Development - Material Sciences Physics Optics

Technical Tags:

Diffraction