Studying signal collection in the punch-through protection area of a silicon micro-strip sensor using a micro-focused X-ray beam

DOI: 10.1016/j.nima.2018.06.085

Authors: Anne-Luise Poley (Deutsches Elektronen-Synchrotron (DESY)) , R. Bates (SUPA School of Physics and Astronomy, University of Glasgow) , I. Bloch (Deutsches Elektronen-Synchrotron (DESY)) , A. J. Blue (SUPA School of Physics and Astronomy, University of Glasgow) , V. Fadeyev (SUPA School of Physics and Astronomy, University of Glasgow) , L. Meng (University of Liverpool) , L. Rehnisch (Humboldt-Universität zu Berlin) , M. Stegler (Deutsches Elektronen-Synchrotron (DESY)) , Y. Unno (High Energy Accelerator Research Organization (KEK))
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Nuclear Instruments And Methods In Physics Research Section A: Accelerators, Spectrometers, Detectors And Associated Equipment

State: Published (Approved)
Published: July 2018
Diamond Proposal Number(s): 15979

Abstract: For the Phase-II Upgrade of the ATLAS detector The ATLAS Collaboration (2008) [1], a new, all-silicon tracker will be constructed in order to cope with the increased track density and radiation level of the High-Luminosity Large Hadron Collider. While silicon strip sensors are designed to minimise the fraction of dead material and maximise the active area of a sensor, concessions must be made to the requirements of operating a sensor in a particle physics detector. Sensor geometry features like the punch-through protection deviate from the standard sensor architecture and thereby affect the charge collection in that area. In order to study the signal collection of n + -p − -p + silicon strip sensors over their punch-through-protection area, ATLAS silicon strip sensors were scanned with a micro-focused X-ray beam at the Diamond Light Source. Due to the highly focused X-ray beam ( 2×3μm2 ) and the short average path length of an electron after interaction with an X-ray photon ( ≤2μm ), local signal collection in different sensor areas can be studied with high resolution. This study presents results of high resolution 2D-scans of the punch-through protection region of ATLAS silicon micro-strip sensors, showing how far the strip signal collection area extends toward the bias ring and how the region is affected by radiation damage.

Journal Keywords: ATLAS; Silicon strip sensors; Radiation damage; Punch-through protection

Subject Areas: Physics


Instruments: B16-Test Beamline

Added On: 11/07/2018 08:59

Discipline Tags:

Detectors Engineering & Technology

Technical Tags:

Diffraction