Article Metrics


Online attention

A two-color beamline for electron spectroscopies at Diamond Light Source

DOI: 10.1080/08940886.2018.1483653 DOI Help

Authors: Tien-Lin Lee (Diamond Light Source) , David A. Duncan (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Synchrotron Radiation News , VOL 31 , PAGES 16 - 22

State: Published (Approved)
Published: July 2018

Open Access Open Access

Abstract: Diamond Light Source's Surface and Interface Structural Analysis beamline (I09) is the first in the world designed to deliver both hard and soft X-rays with optimized, independent sources and optics. With the extended energy range, we offer a wide variety of X-ray techniques that are based primarily on X-ray photoelectron and absorption spectroscopies, which can be combined to maximize the information one can extract from a visit to the beamline. For photoelectron spectroscopy, this energy range corresponds to an information depth from 0.5 to more than 20 nm, providing the bulk as well as surface sensitivity for depth-profiling of heterostructures and buried interfaces. This unique combination has allowed I09 to develop, since becoming operational in 2013, a user community that is interested in two interconnected research areas. One concentrates on surface chemistry and structures, in particular adsorption of organic molecules on solid surfaces and epitaxial growth of two-dimensional materials. The other area of research deals with the electronic structures of oxide heterointerfaces, electron correlations and metal-insulator transitions, energy research, functionalized materials, and material design. The vast majority of these studies, particularly those on surface structures and lithium ion batteries, have benefited from the use of both soft and hard X-rays at I09. In the following sections, we outline the design, science cases, and future plans of the beamline.

Subject Areas: Physics

Technical Areas:

Added On: 23/07/2018 11:14

_23___07___2018_A Two-Colo.pdf

Discipline Tags:


Technical Tags: