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Signals from fluorescent materials on the surface of silicon micro-strip sensors

DOI: 10.1016/j.nima.2018.07.073 DOI Help

Authors: D. Sperlich (Institut für Physik, Humboldt-Universität zu Berlin) , L. Poley (Deutsches Elektronen-Synchrotron) , I. Bloch (Deutsches Elektronen-Synchrotron) , A. J. Blue (University of Glasgow) , C. Buttar (University of Glasgow) , V. Fadeyev (Cruz Institute for Particle Physics (SCIPP), University of California) , C. Gray (University of Glasgow) , H. Lacker (Humboldt-Universität zu Berlin) , L. Rehnisch (Humboldt-Universität zu Berlin) , M. Stegler (Deutsches Elektronen-Synchrotron)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Nuclear Instruments And Methods In Physics Research Section A: Accelerators, Spectrometers, Detectors And Associated Equipment

State: Published (Approved)
Published: July 2018
Diamond Proposal Number(s): 15979

Abstract: For the High-Luminosity Upgrade of the Large Hadron Collider at CERN, the ATLAS Inner Detector will be replaced with a new, all-silicon tracker (ITk). In order to minimise the amount of material in the ITk, circuit boards with readout electronics will be glued onto the active area of the sensor. Several adhesives, investigated to be used for the construction of detector modules, were found to become fluorescent when exposed to UV light. These adhesives could become a light source in the high-radiation environment of the ATLAS detector. The effect of fluorescent material covering the sensor surface in a high-radiation environment has been studied for a silicon micro-strip sensor using a micro-focused X-ray beam. By positioning the beam parallel to the sensor surface and pointing it both inside the sensor and above the sensor surface inside the deposited glue, the sensor responses from direct hits and fluorescence can be compared with high precision. This contribution presents a setup to study the susceptibility of silicon strip sensors to light contamination from fluorescent materials and shows their impact on the noise and fake signal rate of a sensor operated in a high-radiation environment.

Journal Keywords: Silicon sensor; X-ray; Fluorecence

Subject Areas: Physics


Instruments: B16-Test Beamline

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