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Low dose defocused probe electron ptychography using a fast direct electron detector

DOI: 10.1017/S1431927618001423 DOI Help

Authors: Christopher Allen (Diamond Light Source; University of Oxford) , Jiamei Song (Nanjing University) , Mohsen Danaie (Diamond Light Source) , Peng Wang (Nanjing University) , Angus I. Kirkland (University of Oxford; Diamond Light Source)
Co-authored by industrial partner: No

Type: Conference Paper
Conference: Microscopy & Microanalysis 2018
Peer Reviewed: No

State: Published (Approved)
Published: August 2018
Diamond Proposal Number(s): 17918

Abstract: The advent of fast direct-electron detectors has expanded the available dataset of a STEM experiment from an integer to a two-dimensional diffraction pattern at each probe position in a two dimensional raster scan. One way to exploit these four dimensional data-sets is to ptychographically retrieve the complex specimen exit surface wave function. This exit wave function contains phase information which is not directly accessible using conventional STEM imaging techniques. The ability to quantitatively recover the phase of the exit wave enables the simultaneous imaging of both light and heavy atoms as well as accessing three dimensional information normally absent from projection STEM imaging.

Subject Areas: Technique Development

Diamond Offline Facilities: Electron Physical Sciences Imaging Centre (ePSIC)
Instruments: E02-JEM ARM 300CF

Added On: 15/08/2018 11:14

Discipline Tags:

Physics Technique Development - Physics

Technical Tags:

Microscopy Electron Microscopy (EM) Scanning Transmission Electron Microscopy (STEM)