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Advanced X-ray phase-contrast and dark-field imaging with the unified modulated pattern analysis (UMPA)

DOI: 10.1017/S1431927618012539 DOI Help

Authors: Marie-christine Zdora (Diamond Light Source; University College London) , Pierre Thibault (University of Southampton) , Hans Deyhle (University of Southampton) , Joan Vila-comamala (ETH Zurich) , Willy Kuo (University of Zurich) , Christoph Rau (Diamond Light Source) , Irene Zanette (Diamond Light Source)
Co-authored by industrial partner: No

Type: Conference Paper
Conference: Microscopy & Microanalysis 2018
Peer Reviewed: No

State: Published (Approved)
Published: August 2018

Subject Areas: Technique Development


Instruments: I13-2-Diamond Manchester Imaging

Other Facilities: ESRF