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Full-field hard x-ray microscope designed for materials science applications

DOI: 10.1017/S143192761801348X DOI Help

Authors: Imke Greving (Helmholtz Zentrum Geesthacht) , Silja Flenner (Helmholtz Zentrum Geesthacht) , Emanuel Larsson (Helmholtz Zentrum Geesthacht) , Malte Storm (Diamond Light Source) , Fabian Wilde (Helmholtz Zentrum Geesthacht) , Erica Lilleodden (Helmholtz Zentrum Geesthacht) , Thomas Dose (Helmholtz Zentrum Geesthacht) , Hilmar Burmester (Helmholtz Zentrum Geesthacht) , Lars Lottermoser (Helmholtz Zentrum Geesthacht) , Christian David (Paul Scherrer Institue) , Felix Beckmann (Helmholtz Zentrum Geesthacht)
Co-authored by industrial partner: No

Type: Conference Paper
Conference: 14th International Conference on X-ray Microscopy (XRM2018)
Peer Reviewed: No

State: Published (Approved)
Published: August 2018

Subject Areas: Technique Development


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