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Full-field hard x-ray microscope designed for materials science applications
DOI:
10.1017/S143192761801348X
Authors:
Imke
Greving
(Helmholtz Zentrum Geesthacht)
,
Silja
Flenner
(Helmholtz Zentrum Geesthacht)
,
Emanuel
Larsson
(Helmholtz Zentrum Geesthacht)
,
Malte
Storm
(Diamond Light Source)
,
Fabian
Wilde
(Helmholtz Zentrum Geesthacht)
,
Erica
Lilleodden
(Helmholtz Zentrum Geesthacht)
,
Thomas
Dose
(Helmholtz Zentrum Geesthacht)
,
Hilmar
Burmester
(Helmholtz Zentrum Geesthacht)
,
Lars
Lottermoser
(Helmholtz Zentrum Geesthacht)
,
Christian
David
(Paul Scherrer Institue)
,
Felix
Beckmann
(Helmholtz Zentrum Geesthacht)
Co-authored by industrial partner:
No
Type:
Conference Paper
Conference:
14th International Conference on X-ray Microscopy (XRM2018)
Peer Reviewed:
No
State:
Published (Approved)
Published:
August 2018
Subject Areas:
Technique Development
Technical Areas: