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Single-shot X-ray dark-field imaging with omnidirectional sensitivity using random-pattern wavefront modulator

DOI: 10.1063/1.5047400 DOI Help

Authors: Tunhe Zhou (Diamond Light Source) , Hongchang Wang (Diamond Light Source) , Kawal Sawhney (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Applied Physics Letters , VOL 113

State: Published (Approved)
Published: August 2018
Diamond Proposal Number(s): 19596

Open Access Open Access

Abstract: With the development of multi-modal x-ray imaging techniques, dark-field signals have drawn increasing interest due to the complementary information to the conventional attenuation-contrast signal. The directional sensitivity of the dark-field signal can reveal the orientation of the microstructure of the imaged object. We propose to use single-shot dark-field imaging with a random-pattern wavefront modulator to achieve omni-directional sensitivity, which will be valuable for the study of strongly ordered systems. Compared to previous studies, the proposed method shows significant advance by requiring neither dedicated fabrication of x-ray optics nor prolonged scanning. The treatment has been demonstrated on images acquired both at synchrotron facilities and with a laboratory source. The flexibility and the accessibility ensure the potential for easy implementation of the method to benefit a wide range of fields.

Journal Keywords: Medical imaging; Dark field microscopy; Materials science; Synchrotrons; Nondestructive testing; X-ray imaging; X-ray optics

Subject Areas: Physics

Instruments: B16-Test Beamline