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Single-shot X-ray dark-field imaging with omnidirectional sensitivity using random-pattern wavefront modulator
Authors:
Tunhe
Zhou
(Diamond Light Source)
,
Hongchang
Wang
(Diamond Light Source)
,
Kawal
Sawhney
(Diamond Light Source)
Co-authored by industrial partner:
No
Type:
Journal Paper
Journal:
Applied Physics Letters
, VOL 113
State:
Published (Approved)
Published:
August 2018
Diamond Proposal Number(s):
19596

Abstract: With the development of multi-modal x-ray imaging techniques, dark-field signals have drawn increasing interest due to the complementary information to the conventional attenuation-contrast signal. The directional sensitivity of the dark-field signal can reveal the orientation of the microstructure of the imaged object. We propose to use single-shot dark-field imaging with a random-pattern wavefront modulator to achieve omni-directional sensitivity, which will be valuable for the study of strongly ordered systems. Compared to previous studies, the proposed method shows significant advance by requiring neither dedicated fabrication of x-ray optics nor prolonged scanning. The treatment has been demonstrated on images acquired both at synchrotron facilities and with a laboratory source. The flexibility and the accessibility ensure the potential for easy implementation of the method to benefit a wide range of fields.
Journal Keywords: Medical imaging; Dark field microscopy; Materials science; Synchrotrons; Nondestructive testing; X-ray imaging; X-ray optics
Subject Areas:
Physics
Instruments:
B16-Test Beamline
Documents:
hhgg1.pdf