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Inspecting adaptive optics with at-wavelength wavefront metrology

DOI: 10.1117/12.2320532 DOI Help

Authors: J. Krempasky (Paul Scherrer Institute) , U. Flechsig (Paul Scherrer Institut) , P. Vagovic (Deutsches Elektronen-Synchrotron) , C. David (Paul Scherrer Institut) , F. Koch (Paul Scherrer Institute) , A. Jaggi (Paul Scherrer Institute) , C. Svetina (Paul Scherrer Institut) , Shashidhara Marathe (Diamond Light Source) , D. Batey (Diamond Light Source) , S. Cipiccia (Diamond Light Source) , C. Rau (Diamond Light Source) , F. Seiboth (Deutsches Elektronen-Synchrotron) , M. Seaberg (SLAC National Accelerator Lab.) , U. H. Wagner (Paul Scherrer Institut) , L. Patthey (Paul Scherrer Institut) , L. Mikes (European XFEL)
Co-authored by industrial partner: No

Type: Conference Paper
Conference: SPIE Optical Engineering + Applications, 2018
Peer Reviewed: No

State: Published (Approved)
Published: September 2018
Diamond Proposal Number(s): 19521

Abstract: Preserving the coherence and wavefront of a diffraction limited x-ray beam from the source to the experiment poses stringent quality requirements on the production processes for X-ray optics. In the near future this will require on-line and in-situ at-wavelength metrology for both, free electron lasers and diffraction limited storage rings. A compact and easy to move X-ray grating interferometry (XGI) setup has been implemented by the Beamline Optics Group at PSI in order to characterize x-ray optical components by determining the aberrations from reconstructing the x-ray wavefront. The XGI setup was configured for measurements in the moire mode and tested with focusing optic at Swiss Light Source, Diamond Light Source and LCLS. In this paper measurements on a bendable toroidal mirror, a zone plate, a single and a stack of beryllium compound refractive lenses (CRL) are presented. From these measurements the focal position and quality of the beam spot in terms of wavefront distortions are determined by analysing the phase-signal obtained from the XGI measurement. In addition, using a bendable toroidal mirror, we directly compare radius of curvature measurements obtained from XGI data with data from a long-trace profilometer, and compare the CRL wavefront distortions with data obtained by ptychography.

Journal Keywords: Mirrors; X-rays; Adaptive optics; X-ray optics; Wavefront distortions; Wavefront analysis; Lenses; Light sources; Wavefront metrology; Wavefront aberrations

Subject Areas: Physics

Instruments: I13-1-Coherence

Added On: 25/09/2018 12:09

Discipline Tags:

Optics Physics Metrology

Technical Tags:

Imaging Coherent Diffraction Imaging (CDI) Ptychography