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Implications of X-ray beam profiles on qualitative and quantitative synchrotron micro-focus X-ray fluorescence microscopy

DOI: 10.1107/S160057751801247X DOI Help

Authors: Alexander Morrell (University of Aston) , J. Frederick W. Mosselmans (Diamond Light Source) , Kalotina Geraki (Diamond Light Source) , Konstantin Ignatyev (Diamond Light Source) , Hiram Castillo-michel (European Synchrotron Radiation Facility (ESRF)) , Peter Monksfield (University Hospitals Birmingham) , Adrian T. Warfield (University Hospitals Birmingham; University of Birmingham) , Maria Febbraio (University of Alberta) , Helen M. Roberts (University of Alberta) , Owen Addison (University of Alberta; University of Birmingham) , Richard A. Martin (University of Aston)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Journal Of Synchrotron Radiation , VOL 25

State: Published (Approved)
Published: November 2018
Diamond Proposal Number(s): 16458

Abstract: Synchrotron radiation X-ray fluorescence microscopy is frequently used to investigate the spatial distribution of elements within a wide range of samples. Interrogation of heterogeneous samples that contain large concentration ranges has the potential to produce image artefacts due to the profile of the X-ray beam. The presence of these artefacts and the distribution of flux within the beam profile can significantly affect qualitative and quantitative analyses. Two distinct correction methods have been generated by referencing the beam profile itself or by employing an adaptive-thresholding procedure. Both methods significantly improve qualitative imaging by removing the artefacts without compromising the low-intensity features. The beam-profile correction method improves quantitative results but requires accurate two-dimensional characterization of the X-ray beam profile.

Journal Keywords: X-ray fluorescence microscopy; X-ray fluorescence spectroscopy artefacts

Subject Areas: Technique Development, Physics

Instruments: I18-Microfocus Spectroscopy