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Auto-alignment of X-ray focusing mirrors with speckle-based at-wavelength metrology

DOI: 10.1364/OE.26.026961 DOI Help

Authors: Tunhe Zhou (Diamond Light Source) , Hongchang Wang (Diamond Light Source) , Oliver Fox (Diamond Light Source) , Kawal Sawhney (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Optics Express , VOL 26

State: Published (Approved)
Published: October 2018

Abstract: Significant improvements have been made in the fabrication of diffraction-limited X-ray optics used to pursue an aberration-free wavefront. Alignment of these optics plays a crucial role in the resultant beam quality. Here, we present a simple and fast alignment method based on imaging X-ray near-field speckle patterns, with experimental demonstration using a pair of Kirkpatrick-Baez mirrors. The proposed technique has the potential to be an alternative to conventional methods. It loosens the stringent demand for high-resolution scanning stages compared to conventional knife-edge scan and, hence, can be applied to nano-focusing optics. The flexibility and straightforward implementation of the method allow it to be applied to a wide range of experiments at synchrotron facilities and laboratory-based sources.

Subject Areas: Technique Development


Instruments: B16-Test Beamline

Documents:
oe-26-21-26961.pdf

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