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Superior techniques for eliminating ring artifacts in X-ray micro-tomography
Authors:
Nghia T.
Vo
(Diamond Light Source)
,
Robert. C.
Atwood
(Diamond Light Source)
,
Michael
Drakopoulos
(Diamond Light Source)
Co-authored by industrial partner:
No
Type:
Journal Paper
Journal:
Optics Express
, VOL 26
State:
Published (Approved)
Published:
October 2018

Abstract: Synchrotron-based X-ray micro-tomography systems often suffer severe ring artifacts in reconstructed images. In sinograms the artifacts appear as straight lines or stripe artifacts. These artifacts are caused by the irregular response of a detecting system giving rise to a variety of observed types of stripes: full stripes, partial stripes, fluctuating stripes, and unresponsive stripes. The use of pre-processing techniques such as distortion correction or phase retrieval blurs and enlarges these stripes. It is impossible for a single approach to remove all types of stripe artifacts. Here, we propose three techniques for tackling all of them. The proposed techniques are easy to implement; do not generate extra stripe artifacts and void-center artifacts; and give superior quality on challenging data sets and in comparison with other techniques. Implementations in Python and a challenging data set are available for download.
Subject Areas:
Technique Development
Instruments:
I12-JEEP: Joint Engineering, Environmental and Processing
Documents:
oe-26-22-28396.pdf