Superior techniques for eliminating ring artifacts in X-ray micro-tomography

DOI: 10.1364/OE.26.028396

Authors: Nghia T. Vo (Diamond Light Source) , Robert. C. Atwood (Diamond Light Source) , Michael Drakopoulos (Diamond Light Source)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Optics Express , VOL 26

State: Published (Approved)
Published: October 2018

Abstract: Synchrotron-based X-ray micro-tomography systems often suffer severe ring artifacts in reconstructed images. In sinograms the artifacts appear as straight lines or stripe artifacts. These artifacts are caused by the irregular response of a detecting system giving rise to a variety of observed types of stripes: full stripes, partial stripes, fluctuating stripes, and unresponsive stripes. The use of pre-processing techniques such as distortion correction or phase retrieval blurs and enlarges these stripes. It is impossible for a single approach to remove all types of stripe artifacts. Here, we propose three techniques for tackling all of them. The proposed techniques are easy to implement; do not generate extra stripe artifacts and void-center artifacts; and give superior quality on challenging data sets and in comparison with other techniques. Implementations in Python and a challenging data set are available for download.

Subject Areas: Technique Development


Instruments: I12-JEEP: Joint Engineering, Environmental and Processing

Documents:
oe-26-22-28396.pdf