Show Abstract ▼

Abstract: Single and polycapillary optics has obtained in recent times increasing attention for its potential high efficiency as device for focusing high-energy photons and thermal neutrons. The actually developed and future applications depend strongly on a detailed knowledge of the optical characteristics of such devices. Nevertheless, an exhaustive theoretical treatment of the polycapillary properties is extremely complicated due both to the intrinsic complexity of the structure and of the interaction between the X-ray photon beam and the mono- and polycapillary surfaces. Using PolyCAD, a ray-tracing original package developed by our group, here we report a wide study concerning single and polycapillary optics properties. The software allows easily to simulate the optical path inside cylindrical, conical and curved mono- and polycapillary structures; their focusing properties are also presented and discussed.

Show Abstract ▼

Abstract: X-ray compound refractive lenses (CRL) are becoming a widespread tool for the generation of microfocus spot sizes at synchrotron beamlines. The calculation of their performance by means of ray-tracing is useful for a rapid estimation of flux, resolution and focusing properties achievable in a beamline, when other optics are present, or simply to study the lens acceptance and focusing in the presence of a particular bending magnet, wiggler or undulator X-ray source. The ray-tracing method presented in this paper has been used to calculate the efficiency of beryllium CRL's using, for the instrument layout, realistic source size and divergence, and usual optics like perfect crystal monochromators. It is shown that the intensity transmitted by the lens, the effective aperture and the gain are in good agreement with analytical formulas. Additional information provided when running the program are the precise shape of beam at the focus, and at any position along the optical axis. For instance the intensity distribution at the CRL entrance and exit planes allows a comparison between the effective and the geometrical apertures. Finally, the method provides a precise value for the lens focal distance, which depends on the CRL length.

Show Abstract ▼

Abstract: Ellipsometry and atomic force microscopy (AFM) were used to study the film thickness and the surface roughness of both ‘soft’ and solid thin films. ‘Soft’ polymer thin films of polystyrene and poly(styrene–ethylene/butylene–styrene) block copolymer were prepared by spin-coating onto planar silicon wafers. Ellipsometric parameters were fitted by the Cauchy approach using a two-layer model with planar boundaries between the layers. The smooth surfaces of the prepared polymer films were confirmed by AFM. There is good agreement between AFM and ellipsometry in the 80–130 nm thickness range. Semiconductor surfaces (Si) obtained by anisotropic chemical etching were investigated as an example of a randomly rough surface. To define roughness parameters by ellipsometry, the top rough layers were treated as thin films according to the Bruggeman effective medium approximation (BEMA). Surface roughness values measured by AFM and ellipsometry show the same tendency of increasing roughness with increased etching time, although AFM results depend on the used window size. The combined use of both methods appears to offer the most comprehensive route to quantitative surface roughness characterisation of solid films.

Show Abstract ▼

Abstract: Coherent X-ray diffraction imaging is a rapidly advancing form of lensless microscopy. The phase information of the diffraction pattern is embedded in a sufficiently sampled coherent diffraction pattern. Using advanced computational methods, this diffraction pattern can be inverted to produce an image of a sample with diffraction-limited resolution. It is attractive to use high-power coherent X-ray beams produced by future X-ray free-electron lasers for imaging nanoscale condensed matter, materials and biological samples. Here, the scientific case, requirements and the possible realisation of the coherent X-ray diffraction imaging beamlines at the European XFEL Facility are presented.