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Instruments / Technical Area	Publication Details	Published
Optics	A double-pass Fizeau interferometer system for measuring the figure error of large synchrotron optics Geoff Ludbrook , Simon Alcock , Stewart Scott Advances in Metrology for X-Ray and EUV Optics III DOI: 10.1117/12.861538 Show Abstract ▼ Abstract: A laser Fizeau interferometer system has been developed to characterize the figure error of large synchrotron X-ray mirrors using double-pass geometry. This opto-mechanical assembly comprises integrated rotation and translation stages to control: the output angle of the Fizeau interferometer; the surface normal of the optic under test; and the orientation of a high quality (?/100) retro-reflector. To negate the effects of gravitational deformations, the system can measure long optics (up to 1.5m in length) in the geometry (sideward, downward, or upward facing) in which they will ultimately be used on a synchrotron beamline. The system has been designed to minimize environmental noise and enable the measurement geometry to be changed quickly and safely. Compared to complementary techniques, including slope profilers such as the Diamond-NOM, surface height data from the Fizeau system can be obtained more rapidly (<1 minute). This makes the technique ideally suited to investigate the many degrees of freedom of adaptive optics, including piezo bimorph mirrors. The shape of such optics can also be monitored in real time to observe the dynamic effects of the surface in response to applied voltages. Results are presented to illustrate system performance, including repeatability levels. Calibration of the reference surfaces and the required environmental conditions are also discussed.	Aug 2010
Optics	Using the Power Spectral Density method to characterise the surface topography of optical surfaces Simon Alcock , Geoff Ludbrook SPIE: Advances in Metrology for X-Ray and EUV Optics III DOI: 10.1117/12.861539 Show Abstract ▼ Abstract: Power Spectral Density (PSD) is an alternative method for specifying optical surfaces, and quantifies the contribution of each spatial regime to the total surface error. This approach naturally includes mid-range spatial frequency errors, which are often overlooked. The PSD method has recently been adopted by the Space and Astronomy industries, but has not yet received general acceptance within the synchrotron community. To assess the suitability for specifying synchrotron optics using PSD, Fast Fourier Transforms were performed on topography data from a range of optical surfaces of varying quality and manufacturing techniques. For each grade of optic, the entire regime (~100nm to ~50mm) of surface errors was measured, with overlapping bandwidths, using a micro-interferometer and a Fizeau interferometer. From this heuristic information, root-mean square "roughness" can be predicted over any desired spatial range, thus allowing direct comparison of metrology data obtained by instruments with different spatial bandwidths. We present an efficient approach for calculating 1-D and 2-D PSDs using MATLAB algorithms, and discuss analysis considerations, including "field of view" effects and instrument calibration.	Aug 2010
Optics	Characterizing Synchrotron Optics at Diamond Light Source Simon Alcock , Geoff Ludbrook , Kawal Sawhney Synchrotron Radiation News 23, 25 30 Synchrotron Radiation News DOI: 10.1080/08940880903547330 Show Abstract ▼ Abstract: High brilliance, third generation synchrotrons, such as Diamond Light Source, the UK's national facility, are designed to produce intense beams of infra-red, ultra violet, and X-rays to benefit a wide variety of scientific investigations. In November 2009, 15 beamlines were operational and generating world-class academic and industrial research. By 2012, a further seven beamlines will be welcoming users. The successful scientific exploitation of the intense synchrotron light depends to a significant extent on the quality and performance of beamline optics. As synchrotron beamlines strive to produce micrometer-, and ultimately nanometer-sized focal spots, there is a pressing need for state-of-the-art optics, and the metrology instruments to accurately characterize them.	Feb 2010
Optics	A Fizeau interferometer system, with double-pass and stitching, for characterizing the figure error of large (>1m ) synchrotron optics Geoff Ludbrook , Simon Alcock , Kawal Sawhney SPIE Europe 2009	Jun 2009

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