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15 items found (0 items not approved), displaying 1 to 10.[First/Prev] 1, 2 [Next/Last]
Instruments / Technical Area Publication Details Published Actions
I07-Surface & interface diffraction
Feb 2024
I08-Scanning X-ray Microscopy beamline (SXM)
I09-Surface and Interface Structural Analysis
Aug 2023
B18-Core EXAFS
Feb 2023
B18-Core EXAFS
Jul 2020
I15-Extreme Conditions
Jul 2018
I07-Surface & interface diffraction
Nov 2016
I15-Extreme Conditions
Feb 2016
I15-Extreme Conditions
Jul 2014
B18-Core EXAFS
I15-Extreme Conditions
May 2014
I07-Surface & interface diffraction
Feb 2014

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