Search Results

You searched for all publications:

with publication states 'Published (Approved)'

Search Again...

These results only include publications that have been reviewed and processed by Diamond Light Source. To also view papers that have not yet been processed click here.

You can use the folder icon under Actions to collate papers as required. You can then click on View Folder in the left-hand navigation to review and/or download your folder.

Exact matches
Related results

3 items found (0 items not approved), displaying all items.1

Instruments / Technical Area	Publication Details	Published
I06-Nanoscience (XPEEM)	Improving the soft X-ray reflectivity of Cr/Ti multilayers by co-deposition of B4C Jingtao Zhu , Jiayi Zhang , Haochuan Li , Yuchun Tu , Jinwen Chen , Hongchang Wang , Sarnjeet S. Dhesi , Mingqi Cui , Jie Zhu , Philippe Jonnard Journal Of Synchrotron Radiation 27 DOI: 10.1107/S1600577520011741 Show Abstract ▼ Abstract: The `water window', covering 2.4–4.4 nm, is an important wavelength range particularly essential to biology research. Cr/Ti multilayers are one of the promising reflecting elements in this region because the near-normal-incidence reflectivity is theoretically as high as 64% at 2.73 nm. However, due to multilayer imperfections, the reported reflectivity is lower than 3% for near-normal incidence. Here, B and C were intentionally incorporated into ultra-thin Cr/Ti soft X-ray multilayers by co-deposition of B4C at the interfaces. The effect on the multilayer structure and composition has been investigated using X-ray reflectometry, X-ray photoelectron spectroscopy, and cross-section electron microscopy. It is shown that B and C are mainly bonded to Ti sites, forming a nonstoichiometric TiBxCy composition, which hinders the interface diffusion, supresses the crystallization of the Cr/Ti multilayer and dramatically improves the interface quality of Cr/TiBxCy multilayers. As a result, the near-normal-incidence reflectivity of soft X-rays increases from 4.48% to 15.75% at a wavelength of 2.73 nm.	Nov 2020
I06-Nanoscience (XPEEM)	Multilayer polarizer at the energy of 50–1000 eV Jingtao Zhu , Mingqi Cui DOI: 10.5772/intechopen.70088 Open Access Show Abstract ▼ Abstract: Accurate evaluation of polarization states of the radiation is necessary for polarization-sensitive studies, which requires polarization optical elements, such as polarizer, analyzer, and phase retarder. In extreme ultraviolet (EUV) and soft X-ray region, the closeness of the real part of the refractive index to unity, coupled with high absorption, makes the realization of polarizers such as birefringence and dichroic polarizers impossible. Periodical multilayers are commonly used in polarization study working at the quasi-Brewster angle. To expand narrow spectral bandwidths of periodic multilayers, aperiodic and lateral gradual multilayer polarizers including reflective analyzers and transmission phase retarders are utilized. In this chapter, we demonstrate a series of periodic, aperiodic, and lateral gradual broadband multilayer polarizers with the material combinations of Mo/Si, Mo/Y, Mo/B4C, Cr/C, Cr/Sc, Cr/Ti, Cr/V, WSi2/Si, W/B4C, etc. Different multilayer polarizers correspond to different energy ranges, covering 50–1000 eV totally, including “water window” and the L absorption edges of Fe, Co, and Ni. Polarization measurements are performed at BESSY II, Diamond Light Source, National Synchrotron Radiation Laboratory in Hefei and Beijing Synchrotron Radiation Facility. Some of the polarizers we have developed are applied to the polarization measurements of BESSY II UE56/1-PGM and Beamline 3W1B of Beijing Synchrotron Radiation Facility.	Nov 2017
B16-Test Beamline Optics	Geometrical factor correction in grazing incident x-ray fluorescence experiment Wenbin Li , Jingtao Zhu , Xiaoying Ma , Haochuan Li , Hongchang Wang , Kawal J. S. Sawhney , Zhanshan Wang Review Of Scientific Instruments 83 (5) DOI: 10.1063/1.4722495 Diamond Proposal Number(s): [6503] Show Abstract ▼ Abstract: The geometrical factor in the grazing incident x-ray fluorescenceanalysis is an important angle-dependent term, which can have a great effect on the measured data. In this paper, the effects of the geometrical factor on the florescence yield have been demonstrated. A formula is presented to estimate the geometrical factor, which includes the experimental parameters of the beam and setup. The validity of this formula is proven by the good agreement between the calculated fluorescence yields with the experimental results in grazing incident x-ray fluorescenceanalysis.	May 2012

Publications Database

Search Results

You searched for all publications:

Search Again...

Subject Areas (check all that apply) select all

Instruments used to collect data (check all that apply) select all

Collaborations involved (check all that apply) select all

Diamond Offline Facilities used

Relevant Technical Areas (check all that apply) select all

Menu for Anonymous User