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Instruments / Technical Area	Publication Details	Published	Actions
I16-Materials and Magnetism	An improved polarisation analyser for the I16 beamline at Diamond M. H. Burt , S. P. Collins , S. Green , I. Horswell , J. Li , G. Nisbet , Robert Pocock , Jonathan Spiers , K. G. Wilkinson Mechanical Eng. Design of Synchrotron Radiation Equipment and Instrumentation MEDSI2018 DOI: 10.18429/JACoW-MEDSI2018-THPH05 Open Access Show Abstract ▼ Abstract: The project to upgrade the I16 polarisation analyser was necessary to increase its functionality and to introduce a more robust construction. The requirement that the analyser was to be mounted on a diffractometer meant the construction needed to be as lightweight and as compact as possible. This provided opportunities to explore new collaborative ways of working with both in-house and external suppliers. The paper describes the approach taken to develop lightweight aluminium vacuum chambers working with a company specialising in additive layer manufacturing. In addition, the design of lightweight and compact slit assemblies are detailed; these were developed in collaboration with a supplier of driven linear stages. A novel requirement for the analyser is to have a detector mounted on a rotation axis in vacuum. The results of working with the in-house detector group to develop a design to with all the necessary thermal and electrical connections are described. The paper also describes further use of additive layer manufacturing to produce prototypes that allows the design of a cable management system to be optimised where previously using 3d CAD models had proved unsatisfactory.	Dec 2018
I07-Surface & interface diffraction	MINERVA: A facility to study Microstructure and INterface Evolution in Realtime under VAcuum Chris Nicklin , Josue Martinez-Hardigree , Adam Warne , Stephen Green , Martin Burt , John Naylor , Adam Dorman , Dean Wicks , Salahud Din , Moritz Riede Review Of Scientific Instruments 88 DOI: 10.1063/1.4989761 Diamond Proposal Number(s): [14220, 15207] Open Access Show Abstract ▼ Abstract: A sample environment to enable real-time X-ray scattering measurements to be recorded during the growth of materials by thermal evaporation in vacuum is presented. The in situ capabilities include studying microstructure development with time or during exposure to different environmental conditions, such as temperature and gas pressure. The chamber provides internal slits and a beam stop, to reduce the background scattering from the X-rays passing through the entrance and exit windows, together with highly controllable flux rates of the evaporants. Initial experiments demonstrate some of the possibilities by monitoring the growth of bathophenanthroline (BPhen), a common molecule used in organic solar cells and organic light emitting diodes, including the development of the microstructure with time and depth within the film. The results show how BPhen nanocrystal structures coarsen at room temperature under vacuum, highlighting the importance of using real time measurements to understand the as-deposited pristine film structure and its development with time. More generally, this sample environment is versatile and can be used for investigation of structure-property relationships in a wide range of vacuum deposited materials and their applications in, for example, optoelectronic devices and energy storage.	Oct 2017

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