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Perfect X-ray focusing via fitting corrective glasses to aberrated optics

DOI: 10.1038/ncomms14623 DOI Help

Authors: Frank Seiboth (Technische Universität Dresden) , Andreas Schropp (Deutsches Elektronen-Synchrotron DESY) , Maria Scholz (Deutsches Elektronen-Synchrotron DESY) , Felix Wittwer (Deutsches Elektronen-Synchrotron DESY) , Christian Rödel (Institute of Optics and Quantum Electronics, Friedrich-Schiller-Universität Jena; Linac Coherent Light Source, SLAC National Accelerator Laboratory) , Martin Wünsche (Institute of Optics and Quantum Electronics, Friedrich-Schiller-Universität Jena) , Tobias Ullsperger (Institute of Applied Physics, Friedrich-Schiller-Universität Jena) , Stefan Nolte (Institute of Applied Physics, Friedrich-Schiller-Universität Jena) , Jussi Rahomaki (KTH Royal Institute of Technology) , Karolis Parfeniukas (KTH Royal Institute of Technology) , Stylianos Giakoumidis (KTH Royal Institute of Technology) , Ulrich Vogt (KTH Royal Institute of Technology) , Ulrich Wagner (Diamond Light Source) , Christoph Rau (Diamond Light Source) , Ulrike Boesenberg (Deutsches Elektronen-Synchrotron DESY) , Jan Garrevoet (Deutsches Elektronen-Synchrotron DESY) , Gerald Falkenberg (Deutsches Elektronen-Synchrotron DESY) , Eric C. Galtier (Linac Coherent Light Source, SLAC National Accelerator Laboratory) , Hae Ja Lee (Linac Coherent Light Source, SLAC National Accelerator Laboratory) , Bob Nagler (Linac Coherent Light Source, SLAC National Accelerator Laboratory) , Christian G. Schroer (Deutsches Elektronen-Synchrotron DESY)
Co-authored by industrial partner: No

Type: Journal Paper
Journal: Nature Communications , VOL 8

State: Published (Approved)
Published: March 2017

Open Access Open Access

Abstract: Due to their short wavelength, X-rays can in principle be focused down to a few nanometres and below. At the same time, it is this short wavelength that puts stringent requirements on X-ray optics and their metrology. Both are limited by today’s technology. In this work, we present accurate at wavelength measurements of residual aberrations of a refractive X-ray lens using ptychography to manufacture a corrective phase plate. Together with the fitted phase plate the optics shows diffraction-limited performance, generating a nearly Gaussian beam profile with a Strehl ratio above 0.8. This scheme can be applied to any other focusing optics, thus solving the X-ray optical problem at synchrotron radiation sources and X-ray free-electron lasers.

Journal Keywords: Imaging and sensing; Microscopy; X-rays

Subject Areas: Physics


Instruments: I13-1-Coherence

Other Facilities: PETRA III at DESY

Documents:
ncomms14623.pdf