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Perfect X-ray focusing via fitting corrective glasses to aberrated optics
Authors:
Frank
Seiboth
(Technische Universität Dresden)
,
Andreas
Schropp
(Deutsches Elektronen-Synchrotron DESY)
,
Maria
Scholz
(Deutsches Elektronen-Synchrotron DESY)
,
Felix
Wittwer
(Deutsches Elektronen-Synchrotron DESY)
,
Christian
Rödel
(Institute of Optics and Quantum Electronics, Friedrich-Schiller-Universität Jena; Linac Coherent Light Source, SLAC National Accelerator Laboratory)
,
Martin
Wünsche
(Institute of Optics and Quantum Electronics, Friedrich-Schiller-Universität Jena)
,
Tobias
Ullsperger
(Institute of Applied Physics, Friedrich-Schiller-Universität Jena)
,
Stefan
Nolte
(Institute of Applied Physics, Friedrich-Schiller-Universität Jena)
,
Jussi
Rahomaki
(KTH Royal Institute of Technology)
,
Karolis
Parfeniukas
(KTH Royal Institute of Technology)
,
Stylianos
Giakoumidis
(KTH Royal Institute of Technology)
,
Ulrich
Vogt
(KTH Royal Institute of Technology)
,
Ulrich
Wagner
(Diamond Light Source)
,
Christoph
Rau
(Diamond Light Source)
,
Ulrike
Boesenberg
(Deutsches Elektronen-Synchrotron DESY)
,
Jan
Garrevoet
(Deutsches Elektronen-Synchrotron DESY)
,
Gerald
Falkenberg
(Deutsches Elektronen-Synchrotron DESY)
,
Eric C.
Galtier
(Linac Coherent Light Source, SLAC National Accelerator Laboratory)
,
Hae
Ja Lee
(Linac Coherent Light Source, SLAC National Accelerator Laboratory)
,
Bob
Nagler
(Linac Coherent Light Source, SLAC National Accelerator Laboratory)
,
Christian G.
Schroer
(Deutsches Elektronen-Synchrotron DESY)
Co-authored by industrial partner:
No
Type:
Journal Paper
Journal:
Nature Communications
, VOL 8
State:
Published (Approved)
Published:
March 2017

Abstract: Due to their short wavelength, X-rays can in principle be focused down to a few nanometres and below. At the same time, it is this short wavelength that puts stringent requirements on X-ray optics and their metrology. Both are limited by today’s technology. In this work, we present accurate at wavelength measurements of residual aberrations of a refractive X-ray lens using ptychography to manufacture a corrective phase plate. Together with the fitted phase plate the optics shows diffraction-limited performance, generating a nearly Gaussian beam profile with a Strehl ratio above 0.8. This scheme can be applied to any other focusing optics, thus solving the X-ray optical problem at synchrotron radiation sources and X-ray free-electron lasers.
Journal Keywords: Imaging and sensing; Microscopy; X-rays
Subject Areas:
Physics
Instruments:
I13-1-Coherence
Other Facilities: P06 at PETRA III
Added On:
02/03/2017 14:09
Documents:
ncomms14623.pdf
Discipline Tags:
Optics
Physics
Technical Tags:
Imaging
Coherent Diffraction Imaging (CDI)
Ptychography