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14 items found (0 items not approved), displaying 1 to 10.[First/Prev] 1, 2 [Next/Last]

Instruments / Technical Area	Publication Details	Published	Actions
	Diamond Light Source: status and perspectives Gerhard Materlik , Trevor Rayment , Dave Stuart Philosophical Transactions Of The Royal Society A: Mathematical, Physical And Engineering Sciences 373, 20130161 - 20130161 DOI: 10.1098/rsta.2013.0161 PMID: 25624517 Show Abstract ▼ Abstract: Diamond Light Source, a third-generation synchrotron radiation (SR) facility in the UK, celebrated its 10th anniversary in 2012. A private limited company was set up in April 2002 to plan, construct and operate the new user-oriented SR facility, called in brief Diamond. It succeeded the Synchrotron Radiation Source in Daresbury, a second-generation synchrotron that opened in 1980 as the world's first dedicated X-ray-providing facility, closing finally in 2008, by which time Diamond's accelerators and first beamlines were operating and user experiments were under way. This theme issue of Philosophical Transactions of the Royal Society A gives some examples of the rich diversity of research done in the initial five years, with some glimpses of activity up to 2014. Speakers at the 10 year anniversary symposium were drawn from a small number of major thematic areas and each theme was elaborated by a few speakers whose contributions were placed into a broader context by a leading member of the UK academic community in the role of rapporteur. This introduction gives a summary of the design choices and strategic planning of Diamond as a coherent user facility, a snapshot of its present status and some consideration of future perspectives.	Jan 2015
	Directional fine structure in absorption of white x rays: A tomographic interpretation P. Korecki , M. Tolkiehn , D. Novikov , G. Materlik , M. Szymonski Physical Review B 74 (18) DOI: 10.1103/PhysRevB.74.184116 Show Abstract ▼ Abstract: We discuss directional fine structure in absorption of white x rays for tomographic imaging of crystal structure at the atomic level. The interference between a direct x-ray beam and the secondary waves coherently scattered inside a specimen modifies the total wave field at the position of the absorbing atoms. For a white x-ray beam, the wave field variations cancel out by energy integration for all directions, except for the near forward scattering components, coinciding with the incident beam. Therefore, two-dimensional patterns of the angular-dependent fine structure in absorption of white x rays can be interpreted as real-space projections of atomic structure. In this work, we present a theory describing the directional fine structure in white x-ray absorption and a tomographic approach for crystal structure retrieval developed on its basis. The tomographic algorithm is applied to the experimental x-ray absorption data recorded for GaP crystals.	Nov 2006
	X-ray tomographic imaging of crystal structure at the atomic level P. Korecki , M. Tolkiehn , D. Novikov , G. Materlik , M. Szymonski Physical Review Letters 96 (3) DOI: 10.1103/PhysRevLett.96.035502 PMID: 16486723 Show Abstract ▼ Abstract: A direct nondiffractive tomographic algorithm is proposed for the determination of the crystal structure from real-space projections obtained by illuminating the sample with white x rays. This approach was applied to the pattern of the directional fine structure in absorption of white x rays recorded for a GaP crystal and allowed for a determination of the electron density distribution within the unit cell.	Jan 2006
	Desorption site-specificity and halogen minority sites on Si(111) Jan Ingo Flege , Thomas Schmidt , Jan Batjer , Mehmet Cakmak , Gerhard Materlik , Jens Falta New Journal Of Physics 7, 208 DOI: 10.1088/1367-2630/7/1/208 Open Access Show Abstract ▼ Abstract: We identify the SiCl3 bonding geometry as the most desorption-active site in x-ray photon-stimulated desorption (XPSD) of positive chlorine ions from chlorinated Si(1 1 1) surfaces due to their much higher desorption cross-section in comparison to the on-top majority site. The novel combination of x-ray standing waves (XSW), XPSD and density functional theory (DFT) allows to quantitatively determine this trichloride adsorption geometry with high spatial resolution and to deduce the site-specific desorption cross-sections for Cl+ and Cl2+ ions, respectively. Additionally, these SiCl3 groups are shown to exhibit a preferential crystallographic orientation which is confirmed by both XSW and DFT. Moreover, the analoguous identification of desorption-active SiBr3 species for Br/Si(1 1 1) suggests a common physical origin of the site-specific desorption cross-sections.	Oct 2005
	An X-ray BBB Michelson interferometer John P. Sutter , Tetsuya Ishikawa , Ulrich Kuetgens , Gerhard Materlik , Yoshinori Nishino , Armen Rostomyan , Kenji Tamasaku , Makina Yabashi Journal Of Synchrotron Radiation 11, 378 - 385 DOI: 10.1107/S0909049504015468 PMID: 15310953 Show Abstract ▼ Abstract: A new X-ray Michelson interferometer based on the BBB interferometer of Bonse and Hart and designed for X-rays of wavelength similar to1 Angstrom was described in a previous paper. Here, a further test carried out at the SPring-8 1 km beamline BL29XUL is reported. One of the BBB's mirrors was displaced by a piezo to introduce the required path-length difference. The resulting variation of intensity with piezo voltage as measured by an avalanche photodiode could be ascribed to the phase variation resulting from the path-length change, with a small additional contribution from the change of the position of the lattice planes of the front mirror relative to the rest of the crystal. This 'Michelson fringe' interpretation is supported by the observed steady movement across the output beam of the interference fringes produced by a refractive wedge when the piezo voltage was ramped. The front-mirror displacement required for one complete fringe at the given wavelength is only 0.675 Angstrom; therefore, a quiet environment is vital for operating this device, as previous experiments have shown.	Sep 2004
	Reply to "Comment on 'Invalidity of low-pass filtering in atom-resolving x-ray holography'" S. Fanchenko , M. Tolkiehn , D. Novikov , A. Schley , G. Materlik Physical Review B 70 (10) DOI: 10.1103/PhysRevB.70.106102 Show Abstract ▼ Abstract: In their Comment, G. Faigel, M. Tegze, and G. Bortel claim that low-pass filtering can be used to remove the long-range order contributions to the reconstructed images of objects with crystalline internal structure. In this Reply, we present further results, clarifying the problem and supporting the conclusions drawn in the commented paper. We show that the Comment does not provide any evidence to contradict our results.	Sep 2004
	Dry etching characteristics and surface reconstruction of Cl/Si(113) J. I. Flege , Th. Schmidt , G. Materlik , J. Falta Surface Science 566-568, 94 - 99 22nd European Conference on Surface Science (ECOSS 22) DOI: 10.1016/j.susc.2004.05.028 Show Abstract ▼ Abstract: We present a detailed study of the interaction of chlorine with the Si(I 13) surface by means of scanning tunneling microscopy. Upon chlorine adsorption at a substrate temperature of 600 degreesC, the most prominent feature is the presence of (2 x n) reconstructions with n = 2, 3, 5, 7 or 9 in the order of decreasing chlorine coverage. A concurrent process is the rearrangement of step edges from an initially rough appearance to an atomically smooth configuration perpendicular to the [33 (2) over bar] direction.	Sep 2004
	Extinction effects in x-ray holographic imaging with internal reference P. Korecki , D. V. Novikov , M. Tolkiehn , G. Materlik Physical Review B 69 (18) DOI: 10.1103/PhysRevB.69.184103 Show Abstract ▼ Abstract: Secondary extinction effects in x-ray holography with internal atomic reference are examined in the frame of multiple-scattering power transfer equations for a mosaic crystal. The calculations are compared with experimental holograms of an imperfect Cu3Au single crystal measured using x-ray fluorescence and total electron yields. It is shown that extinction effects in imperfect crystals can influence reconstructed real-space images in x-ray atom-resolving holography.	May 2004
	Initial tests of a new X-ray Michelson interferometer John P. Sutter , Ulrich Kuetgens , Gerhard Materlik , Armen Rostomyan Journal Of Applied Crystallography 36, 1432 - 1439 DOI: 10.1107/S0021889803020740 Show Abstract ▼ Abstract: A Michelson interferometer for X- rays of wavelength similar to 1 Angstrom has been proposed to test the temporal coherence of FEL radiation. Such a device has been made at HASYLAB from a silicon single crystal. It is based on the BBB interferometer of Bonse and Hart. One of its mirrors can be pushed by a piezo to introduce the desired beam path difference. For the preliminary tests described in this paper, the crystal was also equipped with an LLL interferometer to check the quality of the crystal and of its preparation. The rotation of a phase- shifting object ( a Plexiglas plate) in one of the LLL's beam paths has been found to produce a fringe pattern which can be shown to yield the phase- shifting material's index of refraction. The interferometer crystal's front section was held fixed with a compression spring. At the same time, the interferometer was bathed in viscous silicone oil to reduce vibrations.	Nov 2003
	Comparative study of MeVC+ and C2+ ion implantation in GaAs(100): Surface roughness and evaluation of lattice strain G. Kuri , G. Materlik , V. Hagen , R. Wiesendanger Journal Of Vacuum Science & Technology B: Microelectronics And Nanometer Structures 21 (3), 1134-1142 DOI: 10.1116/1.1576402 Show Abstract ▼ Abstract: GaAs(100) single crystal substrates have been implanted with 1.00 MeV C + and 2.00 MeV C + 2 at various ion doses. The surfacetopography and roughness of the implantedsurfaces are studied by atomic force microscopy and x-ray reflectometry. Above a threshold dose, production of surface defects is observed, which results in an overall increase of the rms roughness parameter. The enhanced rms roughnesses induced by monomer and by dimer ions at a given dose are comparable. The influence of C + and C + 2 irradiations on the change of lattice parameter in GaAs, and the effect of thermal annealing, are examined by high-resolution x-ray diffraction. For the as-implanted specimens, an increase of the lattice constant, caused by the accumulation of implantation-induced point defects, has been observed and quantified. Thermal treatment of the implantation damage stimulates an almost complete recovery of the primary defects, leaving the crystal practically free from any lattice strain. The electrical characteristics of the C + and C + 2 implantations are also briefly presented and discussed	May 2003

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